Brass-rubber adhesive interphase investigated via depth profiling by using Auger electron spectroscopy

Hammer, G. E.; Shemenski, R. M.; Hunt, J. D.

doi:10.1116/1.579219

Cited by 18 publications

(2 citation statements)

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“…Thus, the resulting Cu x S and ZnO/ZnS layers may have poorer mechanical properties than the as-prepared sample. This could be a reason why the adhesion force was lower after the wet-heat aging treatment . The dezincification probably also removes zinc from the brass alloy, leaving a porous mass of copper that has poor mechanical strength.…”

Section: Resultsmentioning

confidence: 99%

Degradation of a Metal–Polymer Interface Observed by Element-Specific Focused Ion Beam-Scanning Electron Microscopy

et al. 2020

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The degradation of a metal−polymer interface was studied in three dimensions using focused ion beam-scanning electron microscopy (FIB-SEM) with energy-dispersive X-ray spectroscopy. A brass-rubber interface, which is important for tires, was examined as an example of a metal-polymer interface. Brass-plated steel cords were embedded in rubber, which was then vulcanized. The brass-rubber interface was treated at 70 °C under 96% humidity for up to 14 days (a wet-heat aging treatment). FIB-SEM provided clear three-dimensional images of the adhesive layer consisting of brass (CuZn), Cu x S, and ZnO/ZnS between the steel cords and rubber. During degradation, Cu x S at the interfaces diffused into the rubber, resulting in the direct contact of bare steel with rubber. The lack of a substantial adhesive layer explained the degradation of mechanical properties after the wet−heat treatment. In addition, electron diffraction and electron energy loss spectroscopy revealed that the Cu 2 S crystals in the adhesive layer changed to crystal-like CuS during the degradation, which also caused a degradation of mechanical properties because a high Cu valence of x ≈ 2 in Cu x S leads to stronger adhesion than a valence of x = 1.

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Section: Resultsmentioning

confidence: 99%

Degradation of a Metal–Polymer Interface Observed by Element-Specific Focused Ion Beam-Scanning Electron Microscopy

et al. 2020

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“…Thin layers are often depth profiled when we want to analyze the chemical composition and thickness of a single layer or a multilayer structure. In this way, corrosion properties, − diffusion mechanisms, native or artificially prepared oxide layers, , layers that compose integrated circuits, − and the composition of nanoparticles, nanolayers, and nanocomposite coatings, , paints, adhesives, catalysts, , thin polymer films, biological compounds , and even cells and tissues , can be studied. Such analyses can be performed using a variety of surface-sensitive analytical techniques such as SIMS (secondary ion mass spectrometry), XPS (X-ray photoelectron spectroscopy) or AES (Auger electron spectroscopy) in combination with ion sputtering for material removal. − Laser ablation or plasma etching is also an option, but these approaches are less commonly applied.…”

Section: Introductionmentioning

confidence: 99%

ToF-SIMS Depth Profiling of Metal, Metal Oxide, and Alloy Multilayers in Atmospheres of H₂, C₂H₂, CO, and O₂

Ekar

Panjan

Drev³

et al. 2021

J. Am. Soc. Mass Spectrom.

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The influence of the flooding gas during ToF-SIMS depth profiling was studied to reduce the matrix effect and improve the quality of the depth profiles. The profiles were measured on three multilayered samples prepared by PVD. They were composed of metal, metal oxide, and alloy layers. Dual-beam depth profiling was performed with 1 keV Cs + and 1 keV O 2 + sputter beams and analyzed with a Bi + primary beam. The novelty of this work was the application of H 2 , C 2 H 2 , CO, and O 2 atmospheres during SIMS depth profiling. Negative cluster secondary ions, formed from sputtered metals/metal oxides and the flooding gases, were analyzed. A systematic comparison and evaluation of the ToF-SIMS depth profiles were performed regarding the matrix effect, ionization probability, chemical sensitivity, sputtering rate, and depth resolution. We found that depth profiling in the C 2 H 2 , CO, and O 2 atmospheres has some advantages over UHV depth profiling, but it still lacks some of the information needed for an unambiguous determination of multilayered structures. The ToF-SIMS depth profiles were significantly improved during H 2 flooding in terms of matrix-effect reduction. The structures of all the samples were clearly resolved while measuring the intensity of the M n H m – , M n O m – , M n O m H – , and M n – cluster secondary ions. A further decrease in the matrix effect was obtained by normalization of the measured signals. The use of H 2 is proposed for the depth profiling of metal/metal oxide multilayers and alloys.

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Alternatives of resorcinol in carbon black filled belt skim compound: A sustainable approach to make tire

Kumawat

Chanda

Das

et al. 2021

Polymer Engineering & Sci

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As per global trends, new legislation, regulations, and restrictions on the use of hazardous materials with respect to environmental concerns, it has become necessary to eliminate resorcinol from the rubber compound as it was generating carcinogenic fumes during processing at high temperature. In this research, two non‐hazardous phenolic resins [A] and [B] were explored, in place of resorcinol, in a typical PCR tire belt skim compound. The entire study includes three phases. In Phase I, resorcinol was substituted with both the resins and it was revealed that they have potential to function as resorcinol in rubber‐brass bonding mechanism with few limitations, primarily as low cure rate. In Phase II, it was adjusted by incorporating TBBS as an additional accelerator but an abrupt loss in extent of adhesion retention was noticed for aged samples. It leads to further investigation in Phase II compositions. In Phase III, a little amount of precipitated silica was formulated, which results into a significant revival of adhesion retention. Eventually, both the compounds were showing faster vulcanizing characteristics, improved aged and un‐aged properties, higher dynamic stiffness, and lower hysteresis. Compound [B] showed best performance in all the properties except fatigue crack growth rate in low strain percentage.

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Brass-rubber adhesive interphase investigated via depth profiling by using Auger electron spectroscopy

Cited by 18 publications

References 0 publications

Degradation of a Metal–Polymer Interface Observed by Element-Specific Focused Ion Beam-Scanning Electron Microscopy

Degradation of a Metal–Polymer Interface Observed by Element-Specific Focused Ion Beam-Scanning Electron Microscopy

ToF-SIMS Depth Profiling of Metal, Metal Oxide, and Alloy Multilayers in Atmospheres of H₂, C₂H₂, CO, and O₂

Alternatives of resorcinol in carbon black filled belt skim compound: A sustainable approach to make tire

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Brass-rubber adhesive interphase investigated via depth profiling by using Auger electron spectroscopy

Cited by 18 publications

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Degradation of a Metal–Polymer Interface Observed by Element-Specific Focused Ion Beam-Scanning Electron Microscopy

Degradation of a Metal–Polymer Interface Observed by Element-Specific Focused Ion Beam-Scanning Electron Microscopy

ToF-SIMS Depth Profiling of Metal, Metal Oxide, and Alloy Multilayers in Atmospheres of H2, C2H2, CO, and O2

Alternatives of resorcinol in carbon black filled belt skim compound: A sustainable approach to make tire

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ToF-SIMS Depth Profiling of Metal, Metal Oxide, and Alloy Multilayers in Atmospheres of H₂, C₂H₂, CO, and O₂