“…From several microscopic and spectroscopic studies such as scanning electron microscopy (SEM), cross-sectional transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS) depth profiling, Raman spectroscopy, time-of-flight secondary ion mass spectrometry (TOF-SIMS), and X-ray diffraction (XRD), it has been inferred that various factors such as interface thickness, morphology, crystal phase, and chemical composition at the interface play a significant role in enhancing adhesion between brass and rubber. − However, these techniques have their own limitations and inadequacies. ,,,,,,, Some limitations include a cumbersome preparation process (sectioning and ion polishing) for TEM and damage of the sample due to the use of argon ion (Ar + ) sputtering (for XPS), and therefore a new methodology for the measurement of interfacial characteristics is necessary. , …”