Automatic Test Generation for Digital Electronic Circuits

Abstract

Automatic testgenerators produce testvectors for a digital circuit, given Scott Davidson a description ofthe circuit at the gate leveL Forsmall and testable circuits, Fadi Maamari a high-quality test can be produced without modifying the circuit. For Kwang-Ting Cheng larger, harder-to-test circuits, the technique ofpartial scan can provide excellent fault coverage with limited circuit modification. Where test modification can notbe tolerated, test-generation tools can help byprovidinga powerful testability diagnostic capability to assist the designer in writing tests byhand.