Efficient strategies t o perform selectively fault-free simulation. critical path tracing in fanout-free regions, and fault simulation of stem faults in a parallel pattern evaluation environment are presented and analyzed in implementation independent manner. The dynamic changes in the complexity of the fault simulation components as the fault simulation progresses and faults are detected are shown t o be extremely significant. In particular, fault-free simulation tends to quickly become more expensive then both the critical path tracing within fanout-free regions and the explicit simulation of stem faults. In addition. the presence of redundant faults is shown t o have an inhibiting effect on the reduction of the fault simulation complexity.
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