Testing Goes Critical Path

Abstract

Within the past few years, testing technology has become a critical, limiting factor in manufacturing leading‐edge products at competitive cost and quality. In this paper, we highlight key drivers for this phenomenon, and outline some of the emerging approaches to testing. These approaches are more fully described in the articles in this issue of the AT&T Technical Journal.

A Two-Level Process for Diagnosing Crosstalk in Photonic Dilated Benes Networks

“…This paper addresses diagnostic approaches suitable for photonic switching networks, especially DBNs. As in many fields of the electronics industry, testing has become increasingly important in the integrated procedure of design, fabrication, and operation [10]. Being able to diagnose a DBN and obtain measurements related to crosstalk in a timely and effective way is particularly important.…”