Trends in Digital Device Test Methodologies

Abstract

The rapid movement toward ultra-large-scale integration (ULSI) is significantly increasing the demands on testing technology for digital devices. Evolving test methodologies mustbe well integrated into the overall product realization process -from initial concept, through design, to field support. To maintain ever-increasing quality standards, high-quality tests mustidentify defective units at eachlevel ofsystem hierarchy. In addition, they must isolate faults to allow for efficient replacement and repair. Future demands on testing technology can be divided into sixmajor areas: product quality, device technology, testability scope, process integration, efficiency, and automation.