Application of a pulsed laser for evaluation and optimization of SEU-hard designs

Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation

“…In previous studies, very good correlation between pulsedlaser and heavy-ion irradiation has been reported for SEU and SEL in a range of semiconductor technologies that are characterized by shallow junctions [13,14]. While the present study exhibits better than a factor of two agreement (in the deposited charge) between the ion and laser in all cases, the quantitative correlation is not, in general, of the same quality as in that previous work.…”

Practicality of evaluating soft errors in commercial sub-90 nm CMOS for space applications

“…While there have been several direct comparisons of pulsed laser data to heavy ion data, cf. [54][55][56], the pulsed laser technique's speed, spatial correlation, and ease of energy adjustment are the most valuable features. However, as technologies scale, the once relatively small laser spot size of 1-2 µm is now large compared to single transistors meaning that it is impossible to probe single devices in 65 and 45 nm process technologies with current pulsed laser techniques.…”

Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

“…Proton test energies incident on the DUT are listed in Table II. Laser SEE tests were performed at the pulsed laser facility at the Naval Research Laboratory (NRL) [8] [9]. The laser light had a wavelength of 590 nm resulting in a skin depth (depth at which the light intensity decreased to 1/e -or about 37% -of its intensity at the surface) of 2 µm.…”