Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation

Abstract

Abstract--Generally good agreement was obtained between the single-event output voltage transient waveforms obtained by exposing individual circuit elements of a bipolar comparator and operational amplifier to an ion microbeam, a pulsed laser beam, and circuit simulations using SPICE. The agreement was achieved by adjusting the amounts of charge deposited by the laser or injected in the SPICE simulations. The implications for radiation hardness assurance are discussed.

Pulsed-laser testing methodology for single event transients in linear devices

“…Clearly, the ion data are coincident with the pulsed-laser data. This result is not unexpected considering the excellent agreement previously observed between individual SET pulse shapes generated for this device using heavy ions and pulsed laser light [7], [9]. Another advantage of this approach is the ability to identify the origins of each one of the ion data points, something that is normally not possible when using a broad ion beam.…”

“…For two particular linear devices-a voltage comparator (LM111) and an operational amplifier (LM124)-the shapes of all SETs generated by heavy ions in a variety of different configurations could be matched exactly with SETs generated by a pulsed laser [7], [12] Analogous results have been observed for a range of other devices (LM119, LM139, OP27, LM6144), but they have not been studied as extensively. Metal coverage, always an issue for pulsed-laser SEE testing, has, for the most part, not limited the acquisition of SETs in linear circuits because most transistors are relatively large and free of metal.…”

“…D Numerous reports in the literature describe the application of a pulsed laser to the evaluation of SETs in linear circuits [7]- [9], [12] These reports demonstrate the excellent agreement between SET pulse shapes generated by laser light and by heavy ions. For two particular linear devices-a voltage comparator (LM111) and an operational amplifier (LM124)-the shapes of all SETs generated by heavy ions in a variety of different configurations could be matched exactly with SETs generated by a pulsed laser [7], [12] Analogous results have been observed for a range of other devices (LM119, LM139, OP27, LM6144), but they have not been studied as extensively.…”

“…Metal coverage, always an issue for pulsed-laser SEE testing, has, for the most part, not limited the acquisition of SETs in linear circuits because most transistors are relatively large and free of metal. In those cases where junctions are covered with metal, it is still possible to produce SETs by focusing the light on areas adjacent to the metal and relying on charge diffusion [7]. Using this approach, it was possible to generate the full spectrum of SETs in all linear devices tested to date.…”

Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future

“…The temporal characteristics of SEEs in dynamic circuits can be measured by synchronizing the circuit clock to the laser trigger and adding delay [38]. Although the charge generation mechanisms for ionizing particles differ fundamentally from those for ionizing photons, both experimental and theoretical investigations show that the resulting voltage transients are, in many cases, indistinguishable [39], [40]. The pulsed-laser technique does suffer from a significant limitation-the inability of the light to penetrate metal layers on the surface of a device.…”