International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006. 2006
DOI: 10.1109/dtis.2006.1708733
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Analysis of CNTFET physical compact model

Abstract: Abstract-On the basis of acquired knowledge, we present a DC compact model designed for the conventional CNTFET (C-CNTFET) featuring a doping profile similar to n-MOSFET. The specific enhancement lies on the implementation of a physical based calculation of the minima of energy conduction subbands. This improvement allows a realistic analysis of the impact of CNT helicity and radius on the dc characteristics. The purpose is to enable the circuit designers to challenge CNTFET potentialities for performing logic… Show more

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Cited by 29 publications
(3 citation statements)
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“…The source–drain bias ( V DS ) is what causes the difference between E FS (Fermi energy of the source) and E FD (Fermi energy of the drain). After integrating all of the energy sub-bands, the I DS can be written as where e is the electron’s charge, k B is the Boltzmann constant, h is the Planck constant, Δ p is the p th energy sub-band, and T is the temperature.…”
Section: Resultsmentioning
confidence: 99%
“…The source–drain bias ( V DS ) is what causes the difference between E FS (Fermi energy of the source) and E FD (Fermi energy of the drain). After integrating all of the energy sub-bands, the I DS can be written as where e is the electron’s charge, k B is the Boltzmann constant, h is the Planck constant, Δ p is the p th energy sub-band, and T is the temperature.…”
Section: Resultsmentioning
confidence: 99%
“…A simple model for ballistic nanotransitors is described in [11,12]. For details about this model, we refer the reader to [13][14][15]. In this model, the gate voltage V gs induces charge in the CNTFET channel Q cnt .…”
Section: Approachmentioning
confidence: 99%
“…It is a surface potential-based SPICE model simulating CNTs with ballistic conduction behavior. The other compact model used here comes from IMS [4], with the description of the total charge on the nanotube. It explores the DC as well as the dynamical characteristics of the CNTFET.…”
Section: B Nano-componentsmentioning
confidence: 99%