“…Edge recombination can be a particularly significant parasitic loss mechanism in small-area solar cells, such as laboratory-scale high efficiency solar cells, concentrator solar cells, and novel devices which rely on small area solar cells to be interconnected for low current, high voltage applications [13,14], as the losses are accentuated due to the large perimeter to area ratio present in these types of structures [15]. Several methods have been used to perform edge isolation in a manner to minimise the amount of recombination at the edge region, typically introducing an isolation groove around the edge [9,16] or partially cutting the cell out of the host wafer [17] at the front end of processing, such that the groove or cut face can be damage etched and well-passivated with a thermally grown oxide.…”