A new method to quantify retention-failed cells of an EEPROM CAST

Roux, Catherine; Lopez, L.; Firiti, Abdellatif; Ogier, Jean-Luc; Lalande, F.; Laffont, R.; Micolau, G.

doi:10.1016/j.microrel.2007.07.083

Cited by 6 publications

(5 citation statements)

References 4 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…A method using EMMI technique of visualization has been recently proposed to evaluate the number of extrinsic cells in a CAST [12]. First, we test our deconvolution on I-V characteristics used for the EMMI technique.…”

Section: Comparison With Existing Resultsmentioning

confidence: 99%

“…Thus, we compare the number of extrinsic cells evaluated by our deconvolution and the number found with the EMMI technique. For these measurements, in the original paper [12], we describe one extrinsic cell with V T around 2 V and five extrinsic cells with V T around 2.8 V. To evaluate the results given by the 'deconvolution' method, the extracted e þ (v) function is plotted in Figure 12. The function e þ is classically plotted.…”

Section: Comparison With Existing Resultsmentioning

confidence: 99%

“…The latter could be found by different inverse resolutions of Gaussian deconvolution, for instance by extraction of statistical parameters [7,9] or by a Gaussian deconvolution procedure as classically done in a medical device [10,11]. In order to avoid the extraction of the intrinsic part of the curve, we have recently proposed two non-computing methods to estimate the number of extrinsic cells in an EEPROM CAST [12,13]. The first method which is experimental and visual is based on the EMMI technique [14].…”

Section: Classical Exploitation Of Experimental Cast Characteristicsmentioning

confidence: 99%

“…This deconvolution is made by a classical algorithm using a filter rational transfer function [18]. The quantity n v (v) is extracted from deconvolution of relation (12). From this extracted quantity, we define C 0 as…”

Section: Numerical Implementationmentioning

confidence: 99%

See 3 more Smart Citations

An evaluation of the extrinsic cells number in a memory array using cross-correlation products and deconvolution: an instance of a microelectronics experimental inverse problem

Micolau

Postel-Pellerin

Laffont

et al. 2011

Inverse Problems in Science and Engineering

Self Cite

View full text Add to dashboard Cite

This work is devoted to a new, fast and efficient method of evaluating the number of marginal cells in a non-volatile electrical memory array. This extraction from experimental data is fundamentally an inverse problem. The method proposed here is based on simple cross-correlation functions and de-convoluting operations. With the microelectronics device dimension downscaling, the reliability of non-volatile electrical memory has become crucial and any marginal cell can compromise the functioning of the whole array (containing hundreds of thousands of elementary cells). A specific array called Cell Array Structure Test (CAST) has been developed as a useful characterization tool to statistically study retention and endurance performance with few experimental operations. However, this device cannot easily count the low number of failed cells among hundreds of thousands. That is why we had to develop a mathematical method to extract this major quantity from measurements. This method has been validated on an EEPROM CAST -0.13 mm technology node, but it is extendable to all memory devices integrated in parallel array and more generally to any electrical measurement done in a similar configuration.

show abstract

Section: Comparison With Existing Resultsmentioning

confidence: 99%

Section: Comparison With Existing Resultsmentioning

confidence: 99%

Section: Classical Exploitation Of Experimental Cast Characteristicsmentioning

confidence: 99%

Section: Numerical Implementationmentioning

confidence: 99%

See 2 more Smart Citations

An evaluation of the extrinsic cells number in a memory array using cross-correlation products and deconvolution: an instance of a microelectronics experimental inverse problem

Micolau

Postel-Pellerin

Laffont

et al. 2011

Inverse Problems in Science and Engineering

Self Cite

View full text Add to dashboard Cite

show abstract

“…As previously detailed in Eq. (1), charge loss phenomenon is directly linked to electrons leaking from the floating gate, decreasing the total number of stored electrons and so inducing a progressive data loss [6][7][8]. In order to improve this reliability criterion, two major ways can be followed.…”

Section: Introductionmentioning

confidence: 99%