An evaluation of the extrinsic cells number in a memory array using cross-correlation products and deconvolution: an instance of a microelectronics experimental inverse problem
Abstract:This work is devoted to a new, fast and efficient method of evaluating the number of marginal cells in a non-volatile electrical memory array. This extraction from experimental data is fundamentally an inverse problem. The method proposed here is based on simple cross-correlation functions and de-convoluting operations. With the microelectronics device dimension downscaling, the reliability of non-volatile electrical memory has become crucial and any marginal cell can compromise the functioning of the whole ar… Show more
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