2014 IEEE Asian Solid-State Circuits Conference (A-Sscc) 2014
DOI: 10.1109/asscc.2014.7008853
|View full text |Cite
|
Sign up to set email alerts
|

A 0.43pJ/bit true random number generator

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

0
20
0

Year Published

2016
2016
2024
2024

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 19 publications
(20 citation statements)
references
References 7 publications
0
20
0
Order By: Relevance
“…There are numerous spatiotemporal phenomena in hardware, specially at deep-micron or nanometer scales, that have been used as sources of randomness, and chaotic systems [3][4][5][6]. In CMOS, randomness and jitter in oscillators output [2,7], jitter in digital systems [8,9], metastability in common mode comparators as well as well-known sampling uncertainty of D flip-flops [4], metastability in latch circuits [10], themal noise [1], and edge racing in even-stage inverter rings [3] are just a couple of examples. Oscillator-based and metastable TRNGs have the simplest and largest circuits, receptively with oscillator-based TRNGs suffering from reported poor randomness [11].…”
Section: Introductionmentioning
confidence: 99%
“…There are numerous spatiotemporal phenomena in hardware, specially at deep-micron or nanometer scales, that have been used as sources of randomness, and chaotic systems [3][4][5][6]. In CMOS, randomness and jitter in oscillators output [2,7], jitter in digital systems [8,9], metastability in common mode comparators as well as well-known sampling uncertainty of D flip-flops [4], metastability in latch circuits [10], themal noise [1], and edge racing in even-stage inverter rings [3] are just a couple of examples. Oscillator-based and metastable TRNGs have the simplest and largest circuits, receptively with oscillator-based TRNGs suffering from reported poor randomness [11].…”
Section: Introductionmentioning
confidence: 99%
“…In this class of TRNGs, the source of randomness is obtained from the measurement of intrinsically random physical phenomena including radioactive decay, photon detection, and various sources of electronic noise in semiconductor devices (e.g., thermal, diffusion, shot, avalanche, flicker, and generation/recombination noises) [95,145,[145][146][147][148][149][150][151]. In the same class of TRNGs, we can also include other approaches proposed in literature, using antennas, sensors, and transducers to retrieve stochastic signals from different sources like, for example, lasers, noisy images taken with digital cameras, the Sun radiation, or the atmosphere dynamics [152][153][154].…”
Section: Circuits To Measure Other Stochastic Physical Processesmentioning
confidence: 99%
“…Furthermore, in these TRNGs, the stochastic signal at the source can have equivalent amplitudes as lower as few tens of microvolts, and a special care has to be taken in the design to make the device robust with respect to circuit mismatches, electromagnetic couplings with the neighbor circuitry, unforeseen aging effects, temperature, and supply-voltage variations. A TRNG exploiting electronic noise and metastability, generating one random bit DOUT each clock period (phase (a) and phase (b)) [145]. Schematic representation of the core structure of a TRNG exploiting the measurement of a stochastic physical process.…”
Section: Circuits To Measure Other Stochastic Physical Processesmentioning
confidence: 99%
See 2 more Smart Citations