This paper presents a low offset voltage, low noise dynamic latched comparator using a self-calibrating technique. The new calibration technique does not require any amplifiers for the offset voltage cancellation and quiescent current. It achieves low offset voltage of 1.69 mV at 1 sigma in low power consumption, while 13.7 mV is measured without calibration. Furthermore the proposed comparator requires only one phase clock while conventionally two phase clocks were required leading to relaxed clock. Moreover, a low input noise of 0.6 mV at 1 sigma, three times lower than the conventional one, is obtained. Prototype comparators are realized in 90 nm 10M1P CMOS technology. Experimental and simulated results show that the comparator achieves 1.69 mV offset at 250 MHz operating, while dissipating 40 μW/GHz ( 20 fJ/conv. ) from a 1.0 V supply.
A 6-bit, 7 mW, 700 MS/s subranging ADC using Capacitive DAC (CDAC) and gate-weighted interpolation fabricated in 90 nm CMOS technology is demonstrated. CDACs are used as a reference selection circuit instead of resistive DACs (RDAC) for reducing settling time and power dissipation. A gate-weighted interpolation scheme is also incorporated to the comparators, to reduce the circuit components, power dissipation and mismatch of conversion stages. By virtue of recent technology scaling, an interpolation can be realized in the saturation region with small error. A digital offset calibration technique using capacitor reduces comparator's offset voltage from 10 mV to 1.5 mV per sigma. Experimental results show that the proposed ADC achieves a SNDR of 34 dB with calibration and FoM is 250 fJ/conv., which is very attractive as an embedded IP for low power SoCs.
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