Using variable angle spectroscopic ellipsometry, optical constants for AlAs (1.4-5.0 eV) are presented which are simultaneously compatible with measured data from four different samples. The below-gap index values are compatible with published prism measured values. The second derivative spectrum are compatible with published values above the direct band gap. The AlAs spectra is Kramers-Kromg self-consistent over the measured range and is compatible with published values from 0.6 to 1.4 eV. The optical constants for thin ((50 A) GaAs caps on AlAs are shown to be different from bulk GaAs values and require special consideration when fitting ellipsometric data. For the thin GaAs caps, the Et and E,+A, critical-point structure is shifted to higher energies as previously observed for GaAs quantum wells. Bulk AlAs optical constants are shown to be different from those of a thin (-20 A) AlAs barrier layer embedded in GaAs. The thin barrier layer exhibits a highly broadened critical-point structure. This barrier broadening effect (AlAs) and the thin cap shifting effects (GaAs) have implications for in situ growth control schemes which make use of the E, and E, +A, critical-point region. 0 1995 American Institute of Physics.
We identify the four allowable phonon modes in InxGa1−xAs on InP:InAs-like transverse optical (TO) (225±2 cm−1), InAs-like longitudinal optical (LO) (233±1 cm−1), GaAs-like TO (255±2 cm−1), and GaAs-like LO (269±1 cm−1), using the selectivity of first-order Raman scattering off the (100) normal surface and the (011) cleaved plane and detailed line-shape analysis employing a sequential simplex optimization procedure. Raman scattering off the (011) cleaved plane was achieved for the first time in thin-film InGaAs using microprobing capabilities (∼1 μm). We also identify another phonon mode R* at 244 cm−1 which is attributed to an alloy disorder mode in these films. For the five identified phonon modes, a linear relationship between the Raman frequencies and composition determined from x-ray diffraction was determined for near-lattice-matched conditions (0.42<1−x<0.52).
The optical constants for thin layers of strained InAs, AlAs, and AlSb have been investigated by spectroscopic ellipsometry and multi-sample analyses. These materials are important for high-speed resonant tunneling diodes in the AlAs/InAs/In 0.53 Ga 0.47 As and AlSb/InAs material systems. Understanding the optical properties for these thin layers is important for developing in situ growth control using spectroscopic ellipsometry. Ex situ room-temperature measurements were made on multiple samples. The resulting fitted optical constants are interpreted as apparent values because they are dependent on the fit model and sample structure. These apparent optical constants for very thin layers can be dependent on thickness and surrounding material, and are generally applicable only for layers found in a similar structural context. The critical point features of optical constants for the strained layers and for the thin unstrained cap layers were found to differ from bulk values, and three principle effects ͑strain, quantum confinement, and thin-barrier critical-point broadening͒ have been identified as responsible. Of these three, the broadening of the E 1 and E 1 ϩ⌬ 1 critical points for thin barrier material is the newest and most pronounced. This thin barrier effect is shown to be a separate effect from strain, and is also observable for the AlAs/GaAs system.
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