Black phosphorous (BP), the most thermodynamically stable allotrope of phosphorus, is a high-mobility layered semiconductor with direct band-gap determined by the number of layers from 0.3 eV (bulk) to 2.0 eV (single layer). Therefore, BP is considered as a natural candidate for broadband optical applications, particularly in the infrared (IR) and mid-IR part of the spectrum. The strong light-matter interaction, narrow direct band-gap, and wide range of tunable optical response make BP as a promising nonlinear optical material, particularly with great potentials for infrared and mid-infrared opto-electronics. Herein, we experimentally verified its broadband and enhanced saturable absorption of multi-layer BP (with a thickness of ~10 nm) by wide-band Z-scan measurement technique, and anticipated that multi-layer BPs could be developed as another new type of two-dimensional saturable absorber with operation bandwidth ranging from the visible (400 nm) towards mid-IR (at least 1930 nm). Our results might suggest that ultra-thin multi-layer BP films could be potentially developed as broadband ultra-fast photonics devices, such as passive Q-switcher, mode-locker, optical switcher etc.
This paper considers a single machine scheduling problem with preventive maintenance. In many cases, a machine must be maintained after it continuously works for a period of time. But most papers in the literature ignore non-availability of the machine. For this reason, this paper studies the problem of scheduling processing of jobs and maintenance of machine simultaneously. The objective is to minimise total completion time of jobs. The problem is proved to be NP-hard in the strong sense. Three heuristic algorithms and a branch and bound algorithm are proposed. Computational experiments are done to evaluate the effectiveness of the algorithms.
Vertical GaN-on-GaN Schottky barrier diodes based on as-grown and regrown samples were fabricated to investigate the effects of the etch-then-regrow process on device performance. The surface roughness increased slightly after dry etching and decreased after regrowth. According to X-ray diffraction results, the etch-then-regrow process caused a slight increase of defect density due to increased edge dislocations. Schottky parameters extracted from forward current-voltage curves, such as turn-on voltages of 0.74 V and 0.72 V, ideality factors of 1.07 and 1.10, and barrier heights of 1.07 eV and 1.05 eV, were obtained for diodes based on the regrown and as-grown samples, respectively. The breakdown voltage of the regrown sample was much lower than the as-grown sample. The regrowth interface can be regarded as a n-doping GaN layer due to the high interface charge density after the etch-then-regrown process. This equivalent n-doping GaN layer reduced the effective thickness of the UID-GaN under the Schottky contact thus causing lower breakdown voltage for the regrown sample. Poole-Frenkel emission and trap-assisted tunneling processes were responsible for the leakage of both as-grown and regrown samples according to the temperature dependence of the reverse currents.INDEX TERMS Schottky barrier diodes, GaN-on-GaN, regrow, leakage, interface.
This paper addresses the problem of handling the uncertainty of demand in a one-supplier-one-retailer supply chain system. Demand variation often makes the real production different from what is originally planned, causing a deviation cost from the production plan. Assume the market demand is sensitive to the retail price in a nonlinear form, we show how to effectively handle the demand uncertainty in a supply chain, both for the case of centralized-decision-making system and the case of decentralized-decision-making system with perfect coordination.
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