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X‐ray photoelectron spectroscopy (XPS) has been used to characterize poly(3,4‐ethylene dioxythiophene)–poly(styrene sulfonate) (PEDT/PSS), one of the most common electrically conducting organic polymers. A correlation has been established between the composition, morphology, and polymerization mechanism, on the one hand, and the electric conductivity of PEDT/PSS, on the other hand. XPS has been used to identify interfacial reactions occurring at the polymer‐on‐ITO and polymer‐on‐glass interfaces, as well as chemical changes within the polymer blend induced by electrical stress and exposure to ultraviolet light. © 2003 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 41: 2561–2583, 2003

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Photoelectron spectroscopy has been used to map out energy level alignment of conjugated polymers at various organic-organic and hybrid interfaces. Specifically, we have investigated the hole-injection interface between the substrate and light-emitting polymer. Two different alignment regimes have been observed: (i) Vacuum-level alignment, which corresponds to the lack of vacuum-level offsets (Schottky–Mott limit) and (ii) Fermi-level pinning, where the substrate Fermi level and the positive polaronic level of the polymer align. The observation is rationalized in terms of spontaneous charge transfer whenever the substrate Fermi level exceeds the positive polaron/bipolaron formation energy per particle. The charge transfer leads to the formation of an interfacial dipole, as large as 2.1 eV.

Electrochemically prepared poly(3,4-ethylenedioxythiophene) (PEDT) poly(styrenesulfonate) (PSS), produced from acidic (PSSH) and basic (PSSNa) PSS, was characterized by cyclic voltammetry CV, UV-vis spectroscopy, in situ conductivity, and XPS spectroscopy and was compared with electrochemically prepared PEDT/tosylate and chemically prepared PEDT/PSS. CV analysis shows that the polymer synthesis is strongly affected by the nucleophilic character of the counteranion. Although CV and UV-vis spectroscopy show that the structure and degree of polymerization (oligomeric, ca. 10 EDT units) of the PEDT backbone is the same for all polymers, XPS is able to explain the different conductivity values for these materials (ranging from 1 S cm -1 for PEDT/PSSNa to 400-450 S cm -1 for PEDT/tosylate) based on doping level and composition. In particular, critical results are observed to be the ratios between sulfonate and thiophene units in the polymers: the higher the PEDT concentration, the higher the conductivity. XPS also explains by solvent-induced nanometer-scale segregation between PEDT/PSS and excess PSS particles the often reported conductivity enhancement of chemically prepared PEDT/PSS upon treatment with polar solvents.