Photoelectron spectroscopy has been used to map out energy level alignment of conjugated polymers at various organic-organic and hybrid interfaces. Specifically, we have investigated the hole-injection interface between the substrate and light-emitting polymer. Two different alignment regimes have been observed: (i) Vacuum-level alignment, which corresponds to the lack of vacuum-level offsets (Schottky–Mott limit) and (ii) Fermi-level pinning, where the substrate Fermi level and the positive polaronic level of the polymer align. The observation is rationalized in terms of spontaneous charge transfer whenever the substrate Fermi level exceeds the positive polaron/bipolaron formation energy per particle. The charge transfer leads to the formation of an interfacial dipole, as large as 2.1 eV.
Electrochemically prepared poly(3,4-ethylenedioxythiophene) (PEDT) poly(styrenesulfonate) (PSS), produced from acidic (PSSH) and basic (PSSNa) PSS, was characterized by cyclic voltammetry CV, UV-vis spectroscopy, in situ conductivity, and XPS spectroscopy and was compared with electrochemically prepared PEDT/tosylate and chemically prepared PEDT/PSS. CV analysis shows that the polymer synthesis is strongly affected by the nucleophilic character of the counteranion. Although CV and UV-vis spectroscopy show that the structure and degree of polymerization (oligomeric, ca. 10 EDT units) of the PEDT backbone is the same for all polymers, XPS is able to explain the different conductivity values for these materials (ranging from 1 S cm -1 for PEDT/PSSNa to 400-450 S cm -1 for PEDT/tosylate) based on doping level and composition. In particular, critical results are observed to be the ratios between sulfonate and thiophene units in the polymers: the higher the PEDT concentration, the higher the conductivity. XPS also explains by solvent-induced nanometer-scale segregation between PEDT/PSS and excess PSS particles the often reported conductivity enhancement of chemically prepared PEDT/PSS upon treatment with polar solvents.
The fundamentals of the energy level alignment at anode and cathode electrodes in organic electronics are described. We focus on two different models that treat weakly interacting organic/metal (and organic/organic) interfaces: the induced density of interfacial states model and the so-called integer charge transfer model. The two models are compared and evaluated, mainly using photoelectron spectroscopy data of the energy level alignment of conjugated polymers and molecules at various organic/metal and organic/organic interfaces. We show that two different alignment regimes are generally observed: (i) vacuum level alignment, which corresponds to the lack of vacuum level offsets (Schottky-Mott limit) and hence the lack of charge transfer across the interface, and (ii) Fermi level pinning where the resulting work function of an organic/metal and organic/organic bilayer is independent of the substrate work function and an interface dipole is formed due to charge transfer across the interface. We argue that the experimental results are best described by the integer charge transfer model which predicts the vacuum level alignment when the substrate work function is above the positive charge transfer level and below the negative charge transfer level of the conjugated material. The model further predicts Fermi level pinning to the positive (negative) charge transfer level when the substrate work function is below (above) the positive (negative) charge transfer level. The nature of the integer charge transfer levels depend on the materials system: for conjugated large molecules and polymers, the integer charge transfer states are polarons or bipolarons; for small molecules' highest occupied and lowest unoccupied molecular orbitals and for crystalline systems, the relevant levels are the valence and conduction band edges. Finally, limits and further improvements to the integer charge transfer model are discussed as well as the impact on device design.
This paper deals with the influence of the nature and number of solid interfaces on the alignment of the columns in a semiconducting discotic liquid crystal. The solid substrates have been characterized in terms of their roughness and surface energy. The alignment of the discotic liquid crystal columns on these substrates has been determined by optical microscopy under crossed polarizers and by tapping-mode atomic force microscopy. The nature of the substrates has negligible influence on the alignment. The key parameter is the confinement imposed to the film. These surprising observations are explained by the antagonist alignment role of gas and solid interfaces.
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