X‐ray photoelectron spectroscopy (XPS) has been used to characterize poly(3,4‐ethylene dioxythiophene)–poly(styrene sulfonate) (PEDT/PSS), one of the most common electrically conducting organic polymers. A correlation has been established between the composition, morphology, and polymerization mechanism, on the one hand, and the electric conductivity of PEDT/PSS, on the other hand. XPS has been used to identify interfacial reactions occurring at the polymer‐on‐ITO and polymer‐on‐glass interfaces, as well as chemical changes within the polymer blend induced by electrical stress and exposure to ultraviolet light. © 2003 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 41: 2561–2583, 2003

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Highly ordered, several nanometers thick films of alkylated large planar, polycyclic aromatic hydrocarbon ͑PAH͒ molecules have been grown on semi-metallic molybdenum disulfide substrates. The films are characterized by a two-dimensional lateral arrangement of columns standing at the surface on a macroscopic scale. The self-assembly of such insulated columns of face-to-face disks with surface-induced vertical alignment has been achieved directly from solution processing. Angle-resolved photoelectron spectra revealed a highly anisotropic quasi-one-dimensional electronic structure with an extended -electronic wave function. An intermolecular dispersion of the highest occupied band of at least 0.15 eV along the stacking direction has been measured. A partial breakdown of the concept of quasimomentum due to the finite size of the nano-objects perpendicular to the stacks is observed.

Interfacial chemistry at indium tin oxide/polymer interfaces is of fundamental importance for the performance of polymer-based light emitting diodes. X-ray photoelectron spectroscopy and Rutherford backscattering spectrometry are used to investigate the stability of the interface formed between indium tin oxide and (i) the light emitting polymer poly(p-phenylenevinylene), and (ii) the hole injecting layer poly(3,4-ethylenedioxythiophene) polystyrenesulfonate. The formed interfaces are not stable and indium-containing species diffuse from the metal oxide surface into the polymer layers.