In this paper the technology of gas sensitive semiconductor structures based on indium oxide thin lms by DC magnetron sputtering of indium with the subsequent thermal oxidation is developed. Structure, surface morphology and chemical composition of the obtained lms have been investigated by electron diraction, scanning electron microscopy, Auger electron spectroscopy, and X-ray photoelectron spectroscopy. Conditions of In2O3 lms formation with high selectivity and sensitivity to NO2, and NH3 are established.
We continue here our previous work where SD powders were significantly strengthened by irradiation with electrons of lower energy under smaller dose. Previous results were obtained from the crushing strength analysis, no XRD was applied. In present work, powders of synthetic diamond with low strengthwere sorted on sets with different grain size. As established, the sets had various crushing strengths and morphology. They were irradiated with high energy electrons (6.5 MeV, D = 2 × 10 19 and D = 6 × 10 19 cm −2 , Tirr = 450 K) and analyzed using XRD (CuKα) before and after irradiation. Nonlinear dependences a(Θ) = f{R(Θ), where a(Θ) is lattice constant and R(Θ) is Raily function, and the discovered extra-splits (additional to α1-α2-doublets on CuKα) of basic peaks in XRD patterns from the SD sets, testified that crystal lattice of diamond in sets was variously distorted, like of cBN doped with rare earth elements. As established, the first irradiation led to decreasing distortions, the more significantly the higher initial strength of the set. The second irradiation produced softening and increasing distortions of crystal lattice of diamond, the more effectively the less initial strength of diamond. XRD allows indirectly to presort synthetic diamond off the material with critically low relative mechanical strength as well as evaluate resistance of diamond crystal lattice against heavy irradiation and other external impacts.
Ion beam assisted deposition of alloying metals (Zn, Cd, Zr, Cr) onto pure aluminum and aluminum alloy substrates from the plasma of a pulsed arc discharge for the purpose of materials corrosion stability was carried out. The Rutherford backscattering spectrometry, electron backscatter diraction, scanning electron microscopy, and electron probe microanalysis methods were applied to investigate composition and microstructure of the prepared layers. It was found that the obtained layers are characterized by amorphous atomic structure and contain the atoms of deposited metal, substrate material components, as well as impurities of oxygen and carbon; their thickness was measured to be ≈30100 nm.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.