In a standard industrial approach the timing performance verification is obtained using a tabular method that necessitates a great amount of simulations. They must specify, for each drive in each logic family: the load, the input slope, the temperature and the supply voltage sensitivity, for each edge, of the transition time and propagation delay. Extending a logical effort like based model of timing performance of CMOS structures we show in this paper that it is possible to define-a specific performance representation allowing a continuous representation of the performance sensitivity of a complete family. We describe the parameter calibration procedure and validate the proposed representation on a 0.13pm process by comparing the performance sensitivity deduced from this representation to sensitivity values obtained from electrical simulations performed with the full process model of the foundry.
ISBN 978-1-4577-1678-2; This paper has been granted the OUTSTANDING PAPER AWARDInternational audienceThis work has introduced a new electrical aging assessment framework for digital systems, based upon strong physics-based foundations and an adequate bottom-up approach which enables propagating accurate reliability knowledge at system level. This work opens new ways to optimize high level digital systems with respect to aging with great accuracy
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