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Significance Surface engineering of halide perovskites (HaPs), semiconductors with amazing optoelectronic properties, is critical to improve the performance and ambient stability of HaP-based solar cells and light emitting diodes (LEDs). Ultrathin layers of two-dimensional (2D) analogs of the three-dimensional (3D) HaPs are particularly attractive for this because of their chemical similarities but higher ambient stability. But do such 2D/3D interfaces actually last, given that ions in HaPs move readily—i.e., what happens at those interfaces on the atomic scale? A special electron microscopy, which as a bonus also reveals the true conditions for nondestructive analysis, shows that the large ions that are a necessary part of the 2D films can move into the 3D HaP, a fascinating illustration of panta rei in HaPs.

Organometal halide perovskite materials are presently some of the pacesetters for light harvesting in hybrid photovoltaic devices because of their excellent inherent electrical and optical properties. However, long-term durability of such perovskite materials remains a major bottleneck for their commercialization especially in countries with hot and humid climatic conditions, thus violating the international standards for photovoltaic technology. Albeit, TiO2 as an electron-transport layer has been well investigated for perovskite solar cells; the high-temperature processing makes it unsuitable for low-cost and large-scale roll-to-roll production of flexible photovoltaic devices. Herein, we have chosen low-temperature (<150 °C)-processable nanostructured ZnO as the electron-selective layer and used a two-step method for sensitizing ZnO nanorods with methylammonium lead iodide (MAPbI3) perovskite, which is viable for flexible photovoltaic devices. We have also elaborately addressed the effect of the annealing duration on the conversion of a precursor solution into the required perovskite phase on ZnO nanostructures. The investigations show that the presence of ZnO nanostructures accelerates the rate of degradation of MAPbI3 films under ambient annealing and thus requires proper optimization. The role of ZnO in enhancing the degradation kinetics of the perovskite layer has been investigated by X-ray photoelectron spectroscopy and a buffer layer passivation technique. The effect of the annealing duration of the MAPbI3 perovskite on the optical, morphological, and compositional behavior has been closely studied and correlated with the photovoltaic efficiency. The study captures the degradation behavior of the commercially interesting MAPbI3 perovskite on a ZnO electron-transport layer and thus can provide insight for developing alternative families of perovskite material with better thermal and environmental stability for application in low-cost flexible photovoltaic technology.

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The interfaces between inorganic selective contacts and halide perovskites (HaPs) are possibly the greatest challenge for making stable and reproducible solar cells with these materials. NiO x , an attractive hole-transport layer as it fits the electronic structure of HaPs, is highly stable and can be produced at a low cost. Furthermore, NiO x can be fabricated via scalable and controlled physical deposition methods such as RF sputtering to facilitate the quest for scalable, solvent-free, vacuum-deposited HaP-based solar cells (PSCs). However, the interface between NiO x and HaPs is still not well-controlled, which leads at times to a lack of stability and V oc losses. Here, we use RF sputtering to fabricate NiO x and then cover it with a Ni y N layer without breaking vacuum. The Ni y N layer protects NiO x doubly during PSC production. Firstly, the Ni y N layer protects NiO x from Ni 3+ species being reduced to Ni 2+ by Ar plasma, thus maintaining NiO x conductivity. Secondly, it passivates the interface between NiO x and the HaPs, retaining PSC stability over time. This double effect improves PSC efficiency from an average of 16.5% with a 17.4% record cell to a 19% average with a 19.8% record cell and increases the device stability.

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