Reactively sputtered nickel oxide (NiOx) films provide transparent, antireflective, electrically conductive, chemically stable coatings that also are highly active electrocatalysts for the oxidation of water to O2(g). These NiOx coatings provide protective layers on a variety of technologically important semiconducting photoanodes, including textured crystalline Si passivated by amorphous silicon, crystalline n-type cadmium telluride, and hydrogenated amorphous silicon. Under anodic operation in 1.0 M aqueous potassium hydroxide (pH 14) in the presence of simulated sunlight, the NiOx films stabilized all of these self-passivating, high-efficiency semiconducting photoelectrodes for >100 h of sustained, quantitative solar-driven oxidation of water to O2(g).
Since the seminal work of Shockley and Queisser, assessing the detailed balance between absorbed and emitted radiative fluxes from a photovoltaic absorber has been the standard method for evaluating solar cell efficiency limits [1][2][3] . The principle of detailed balance is one dictated by reciprocity and steady state, so that photons can be absorbed and emitted with equal probability. This basic principle has also been extended to evaluate the effects of multiple junctions 4,5 , hot carriers 6,7 , nanostructured geometries 8,9 , multiexciton generation 10,11 , sub-unity radiative efficiency 12 and many other solar cell configurations and nonidealities to estimate limiting efficiencies via modifications to the detailed balance model.
Cuprous oxide (Cu
2
O) is a promising material for solar-driven water splitting to produce hydrogen. However, the relatively small accessible photovoltage limits the development of efficient Cu
2
O based photocathodes. Here, femtosecond time-resolved two-photon photoemission spectroscopy has been used to probe the electronic structure and dynamics of photoexcited charge carriers at the Cu
2
O surface as well as the interface between Cu
2
O and a platinum (Pt) adlayer. By referencing ultrafast energy-resolved surface sensitive spectroscopy to bulk data we identify the full bulk to surface transport dynamics for excited electrons rapidly localized within an intrinsic deep continuous defect band ranging from the whole crystal volume to the surface. No evidence of bulk electrons reaching the surface at the conduction band level is found resulting into a substantial loss of their energy through ultrafast trapping. Our results uncover main factors limiting the energy conversion processes in Cu
2
O and provide guidance for future material development.
Excitonic effects account for a fundamental
photoconversion and
charge transport mechanism in Cu2O; hence, the universally
adopted “free carrier” model substantially underestimates
the photovoltaic efficiency for such devices. The quasi-equilibrium
branching ratio between excitons and free carriers in Cu2O indicates that up to 28% of photogenerated carriers during photovoltaic
operation are excitons. These large exciton densities were directly
observed in photoluminescence and spectral response measurements.
The results of a device physics simulation using a model that includes
excitonic effects agree well with experimentally measured current–voltage
characteristics of Cu2O-based photovoltaics. In the case
of Cu2O, the free carrier model underestimates the efficiency
of a Cu2O solar cell by as much as 1.9 absolute percent
at room temperature.
The crystallographic orientation of a metal affects its surface energy and structure, and has profound implications for surface chemical reactions and interface engineering, which are important in areas ranging from optoelectronic device fabrication to catalysis. However, it can be very difficult and expensive to manufacture, orient, and cut single crystal metals along different crystallographic orientations, especially in the case of precious metals. One approach is to grow thin metal films epitaxially on dielectric substrates. In this work, we report on growth of Pt and Au films on MgO single crystal substrates of (100) and (110) surface orientation for use as epitaxial templates for thin film photovoltaic devices. We develop bias-assisted sputtering for deposition of oriented Pt and Au films with sub-nanometer roughness. We show that biasing the substrate decreases the substrate temperature necessary to achieve epitaxial orientation, with temperature reduction from 600 to 350 °C for Au, and from 750 to 550 °C for Pt, without use of transition metal seed layers. In addition, this temperature can be further reduced by reducing the growth rate. Biased deposition with varying substrate bias power and working pressure also enables control of the film morphology and surface roughness.
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