Integrated circuit authentication requires identification using un-clonable digital fingerprints. SRAM power-up state is one such fingerprinting method. In this paper we present a new, more robust hardware technique for generating secret keys and unique serial numbers using SRAM cells' inherent mismatch due to process variations in the constituent transistors. The improved method can be used in operation and is amenable to devices using power-up BIST. It is experimentally demonstrated and analyzed on a 90 nm test chip.
Integrated circuit (IC) identification using unclonable digital fingerprints facilitates the authentication of ICs, device tracking, and cryptographic functions. In this paper, we present two hardware methods exploiting the inherent processinduced mismatch of SRAM cells. The proposed circuits improve upon those previously published by reducing the number of bits that vary from trial to trial, and can be used at times other than just IC power-up. The proposed circuits and methods are compared with the previous power-up approach using the experimental results from a 90-nm test chip. The required SRAM array periphery circuit changes allow the use of standard foundry SRAM cells and do not impact the memory access time.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.