Understanding the influence of water layers adjacent to interfaces is fundamental in order to fully comprehend the interactions of both biological and nonbiological materials in aqueous environments. In this study, we have investigated hydration forces at the mica-electrolyte interface as a function of ion valency and concentration using subnanometer oscillation amplitude frequency modulation atomic force microscopy (FM-AFM). Our results reveal new insights into the nature of hydration forces at interfaces due to our ability to measure high force gradients without instability and in the absence of lateral confinement due to the use of an atomically sharp tip. We demonstrate the influence of electrolytes on the properties of both primary and structural hydration forces and reveal new insights into the interplay between these phenomena in determining the interaction forces experienced by a nanoscale object approaching an interface. We also highlight the difficulty in directly comparing hydration force data from different measurement techniques where the nature of the perturbation induced by differing interaction geometries is likely to dramatically affect the results.

Local ionic environments within nanometer proximity of a surface play a major role in the interactions which occur there and can be of critical importance in, for example, colloid suspensions, as well as biological function. Such environments often vary significantly from bulk properties, as we show here by the direct imaging of a range of monovalent (Li(+), Na(+)) and divalent (Ca(2+), Mg(2+)) cations distributed at the liquid-solid interface of mica. We image local charge distributions relative to the atomic lattice of mica and adjacent structured water and explain how their location is influenced by the electrostatic characteristics of the underlying lattice.

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This study aimed to provide a comprehensive analysis of the factors that determine and shape consumers’ behavioral intention to adopt mobile commerce (m-commerce). By integrating the core constructs from the Unified Theory of Acceptance and Use of Technology (UTAUT), together with the trust-building mechanisms, this study explored the importance of the institutional mechanisms and their moderating effects between trust in the vendors and intention to adopt m-commerce. Traditionally, the effects of institutional mechanisms on trust and adoption intention have been considered separately in different study contexts. The purpose of this study was to extend the literature by simultaneously exploring two institutional mechanisms that are conceptually highly similar to each other, namely, structural assurance (SA) and perceived effectiveness of e-commerce institutional mechanisms (PEEIM). A self-administered survey was used to collect data, which were analyzed using partial least squares structural equation modelling (PLS-SEM). The results revealed that most of the constructs examined have significant relationships with the intention to adopt m-commerce. Additionally, PEEIM exhibits a significant moderating effect but SA does not. This study delineates how trust-building mechanisms play important roles in increasing consumers’ confidence in order to promote m-commerce adoption.

This paper presents the design, characterization, and analysis of a 10 nm silicon negative channel FinFET. To validate the design, we have simulated the output characteristics and transfer characteristics of the transistor. Both of which comply with the standard characteristics of an operational MOSFET. Owing to its efficacy in suppressing short channel effects, the leakage current of the tri-gate transistor is found to be low; whereas, the drive current is sufficiently high. We have also presented the design specifications of the transistor.

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Atomic force microscopy (AFM) has been used extensively in nanoscience research since its invention. Recently, many teaching laboratories in colleges, undergraduate institutions, and even high schools incorporate AFM as an effective teaching tool for nanoscience education. This paper presents an optical beam deflection (OBD) based atomic force microscope, designed specifically for the undergraduate engineering laboratory as a teaching instrument. An electronic module for signal conditioning was built with components that are commonly available in an undergraduate electronic laboratory. In addition to off-the-shelf mechanical parts and optics, the design of custom-built mechanical parts waskept as simple as possible. Hence, the overall cost for the setup is greatly reduced. The AFM controller was developed using National Instruments Educational Laboratory Virtual Instrumentation Suite (NI ELVIS), an integrated hardware and software platform which can be programmed in LabVIEW. A simple yet effective control algorithm for scanning and feedback control was developed. Despite the use of an educational platform and low-cost components from the undergraduate laboratory, the developed AFM is capable of performing imaging in constant-force mode with submicron resolution and at reasonable scanning speed (approximately 18 min per image). Therefore, the AFM is suitable to be used as an educational tool for nanoscience. Moreover, the construction of the system can be a valuable educational experience for electronic and mechanical engineering students.