We present a simulator for resistive bridging and stuck-at faults. In contrast to earlier work, it is based on electrical equations rather than table look-up, thus exposing more flexibility. For the first time, simulation of sequential circuits is dealt with; reciprocal action of fault effects in current time frame and earlier time frames is elaborated on for different bridge resistances. Experimental results are given for resistive bridging and stuck-at faults in combinational and sequential circuits. Different definitions of fault coverage are listed and quantitative results with respect to all these definitions are given for the first time.
Test application at reduced power supply voltage (or VLV testing) is a cost-effective way to increase the defect coverage of a test set. Resistive short defects are a major contributor to this coverage increase. Using a probabilistic model of these defects, we quantify the coverage impact of VLV testing for different voltages. When considering the coverage increase, we differentiate between defects missed by the test set at nominal voltage and undetectable defects (flaws) detected by VLV testing. In our analysis, the performance degradation of the device caused by lower power supply voltage is accounted for. Furthermore, we describe a situation in which defects detected by conventional testing are missed by VLV testing and quantify the resulting coverage loss. We report the numbers on the increased defect coverage, flaw coverage, and coverage loss for ISCAS circuits.
We present a simulator for resistive bridging and stuck-at faults. In contrast to earlier work, it is based on electrical equations rather than table look-up, thus exposing more flexibility. For the first time, simulation of sequential circuits is dealt with; reciprocal action of fault effects in current time frame and earlier time frames is elaborated on for different bridge resistances. Experimental results are given for resistive bridging and stuck-at faults in combinational and sequential circuits. Different definitions of fault coverage are listed and quantitative results with respect to all these definitions are given for the first time.
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