Information about the condition of electronic systems in use supports reliability, maintenance and safety. This paper describes an approach to condition monitoring using monitoring structures. With such structures, the remaining life time of a system can be estimated in field use under varying load. The design and evaluation of monitor structures sensible to thermo-mechanical load is shown. Technological boundaries are taken into consideration and an example of a flip chip based monitor structure is presented. The tailoring of the structure regarding the failure model is described in general and in detail. To achieve a robust structure, parametric finite element modeling of technological fabrication tolerance is carried out to determine the selectivity of the structures. Analyzing the results of the finite element study, conclusions concerning the statistical distribution of the failure are drawn and suggestions are made to improve the accuracy of condition monitoring
During the last years within power electronics packaging a trend towards compact power electronics modules for automotive and industrial applications could be observed, where a smart integrated control unit for motor drives is replacing bulky substrates with discrete control logic and power electronics. Most recent modules combine control and power electronics yielding maximum miniaturization. Transfer molding is the method of choice for cost effective encapsulation of such modules due to robustness of the molded modules and moderate cost of packaging. But there are challenges with this type of package: Typically those packages are asymmetric, a substrate with single sided assembly is overmolded on the component side and the substrate backside is exposed providing a heat path for optimized cooling. This asymmetric geometry is prone to yield warped substrates, preventing optimum thermal contact to the heatsink and also putting thermomechanical stress on the encapsulated components, possibly reducing reliability. Such packages being truly heterogeneous, combining powerICs, wire bonds, SMDs, controlICs, substrate and leadframe surfaces, the encapsulant used needs to adhere sufficiently to all surfaces present. Additionally those packages need to operate at elevated temperatures for increased times, e.g. operate at 150 °C for 2000 h and more, so high thermal stability is of ample importance. Within this paper a reference application is described, integrating power and control logic inside a leadframe based molded package. Taking into account the challenges mentioned above, a detailed description of material selection for this module will be given, including material analysis as rheology, reactivity, change in ɛr and thermomechanical properties as f(t,T) and of media storage. Process development tools for module molding are used to ensure manufacturability and useability. Concluding rules for encapsulant material selection and package setup are provided.
3D-integration becomes more and more an important issue for advanced LED packaging solutions as it is a great challenge for the thermo-mechanical reliability to remove heat from LEDs to the environment by heat spreading or specialized cooling technologies. Thermal copper-TSVs provide an elegant solution to effectively transfer heat from LED to the heat spreading structures on the backside of a substrate. But, the use of copper-TSVs generates also novel challenges for reliability as well as also for reliability analysis and prediction, i.e. to manage multiple failure modes acting combined - interface delamination, cracking and fatigue, in particular. In this case, the thermal expansion mismatch between copper and silicon yields to risky stress situations. Therefore, the authors performed extensive simulative work to overcome cracking and delamination risks in the vicinity of thermal copper-TSVs by means of fracture mechanics approaches. Especially, an interaction integral approach is utilized within a simulative DoE and X-FEM is used to help clarifying crack propagation paths in silicon. The DoE-based response surface methodology provided a good insight into the role of model parameters for further optimizations of the intended thermal TSV-approaches in LED packaging applications
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.
hi@scite.ai
10624 S. Eastern Ave., Ste. A-614
Henderson, NV 89052, USA
Copyright © 2024 scite LLC. All rights reserved.
Made with 💙 for researchers
Part of the Research Solutions Family.