No abstract

This paper analyses the three-dimensional (3-D) surface morphology of thin films of Fe on Cu nanoparticles (NPs) synthesized by Direct-Current (DC) magnetron sputtering deposited on glass substrates. Four samples coated with copper and iron and deposited on the glass surface were used as research materials. Thin films were obtained by means of DC reactive magnetron sputtering method. The copper coating of each sample was 55 nm thick. In addition, the second, third and fourth samples had a coating of iron, with a thickness of 40 nm, 55 nm, and 70 nm, respectively.The sample surface images were obtained by using an atomic force microscope operating in a contactless mode.The 3-D of the surface samples was divided into motifs of significant peaks and pits using MountainsMap® Premium software, which uses the watershed segmentation algorithm. In addition, the highest and lowest points of motifs are localized. The parameters relating to all the segmented motifs consistent with ISO 25178-2: 2012 have been generated using the software. They allow for motif analysis, detection of essential characteristics and their characterization in terms of surface dimensions, volume, curvature, shape, structure etc. MountainsMap® Premium software makes it possible to perform 3-D segmentation of sample surface images and identify all sorts of motifs, such as peaks, pits or irregular shapes in correlation with the surface statistical parameters. The analysis of motifs helps to understand their functional role in the test surface, in order to evaluate the relation among the 3-D micro-textured surface.

No abstract

As the environment and the human body face harmful effects of toxic gases such as carbon monoxide (CO), many research efforts have been directed toward elimination of these species through various adsorption processes. Unique properties of γ-Al 2 O 3 in CO capture have led us to prepare SnO 2 /Al 2 O 3 , Ni/Al 2 O 3 , and SnO 2 /Ni/Al 2 O 3 composite nanocrystalline films using the roll-coating method. The crystalline structure and morphology of the coatings were investigated using X-ray diffraction and field-emission scanning electron microscopy, respectively. The performed analyses revealed the complex microstructure of the coatings composed of fine grains and welldispersed nanoparticles that aggregated to form larger welldeveloped clusters. Following this, adsorption characteristics of the samples were measured using the KIMO KIGAZ 210 continuous flow gas analyzer. Finally, the kinetics of the CO adsorption process was studied using various diffusion models: pseudo-first-order, pseudo-second-order, and intraparticle.

No abstract

No abstract

The purpose of the present study is to evaluate the effects of different laser irradiations including Nd-YAG (neodymium-doped yttrium aluminum garnet laser; Nd:Y3Al5O12), Er-YAG (erbium-doped yttrium aluminum garnet laser, erbium YAG laser), and Carbon dioxide (CO2) infrared lasers on surface topography of zirconia-based ceramics samples which were prepared by copy milling technique. Three dimensional (3D) atomic force microscopy (AFM) images were applied to investigate surface properties by extracting information via MountainsMap® Premium software which divides the surface into peaks and pits and through watershed segmentation algorithm. This method made motif analysis possible by detecting surface dimensions, curvature, volume, perimeters, shape, structure, etc.

This work describes an analysis of titanium dioxide (TiO 2 ) thin films prepared on silicon substrates by direct current (DC) planar magnetron sputtering system in O 2 /Ar atmosphere in correlation with three-dimensional (3D) surface characterization using atomic force microscopy (AFM). The samples were grown at temperatures 200, 300, and 400 C on silicon substrate using the same deposition time (30 min) and were distributed into four groups: Group I (as-deposited samples), Group II (samples annealed at 200 C), Group III (samples annealed at 300 C), and Group IV (samples annealed at 400 C). AFM images with a size of 0.95 μm × 0.95 μm were recorded with a scanning resolution of 256 × 256 pixels. Stereometric analysis was carried out on the basis of AFM data, and the surface topography was described according to ISO 25178-2:2012 and American Society of Mechanical Engineers (ASME) B46.1-2009 standards. The maximum and minimum root mean square roughnesses were observed in surfaces of Group II (Sq = 7.96 ± 0.1 nm) and Group IV (Sq = 3.87 ± 0.1 nm), respectively. K E Y W O R D S atomic force microscopy, fractal analysis, stereometric analysis, TiO 2 thin films