“…In the last decades, AFM was applied as a modern tool for characterizing surface geometry (Mahmoodi, Solaymani, Amini, Nezafat, & Ghoranneviss, ; Sobola, Ţălu, Solaymani, & Grmela, ; Solaymani et al, ; Ţălu, ; Zolotarevskii, Novikov, Gusev, & Lyaskovskii, ). Furthermore, stereometric and fractal/multifractal analyses are suitable tools to characterize the nanoscale patterns in 3D complex surfaces of thin films because of their wide range of applications.…”