Real-time monitoring of optical anisotropy during growth by the chemical mist deposition of poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT:PSS) films was carried out using spectroscopic ellipsometry. The microstructure of the grown films was found to be primarily determined by the DC bias applied to the mesh electrode. The ellipsometry results revealed that uniaxial anisotropy appeared for film thicknesses of about 5 nm and above, which corresponds to the average size of PEDOT crystallites. The extraordinary refractive index was found to be strongly correlated with the carrier mobility. Both the degree of optical anisotropy and the carrier mobility could be controlled during film growth by adjusting the DC bias.
The electrospray deposition (ESD) of poly(3-hexylthiophene) (P3HT) films for use in crystalline silicon/organic hybrid heterojunction solar cells on a crystalline silicon (c-Si) wafer was investigated using real-time characterization by spectroscopic ellipsometry (SE). In contrast to the nonuniform deposition of products frequently obtained by spin-coating, a uniform deposition of P3HT films was achieved on flat and textured hydrophobic c-Si wafers by adjusting the deposition conditions. Similar findings were also obtained for the deposition of conductive poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) (PEDOT:PSS) on P3HT. The c-Si/P3HT/PEDOT:PSS heterojunction solar cells exhibited efficiencies of 4.1 and 6.3% on flat and textured c-Si wafers, respectively. These findings suggest that ESD is a promising method for the uniform deposition of P3HT and PEDOT:PSS films on flat and textured hydrophobic substrates.
The above article, published online on 25 July 2012 in Wiley Online Library (http://wileyonlinelibrary.com), has been retracted by agreement between the authors, the journal Editor‐in‐Chief, Stefan Hildebrandt, and Wiley‐VCH GmbH & Co. KGaA. The retraction has been agreed since the contents of the article have already been published by the corresponding author in Jpn. J. Appl. Phys. 51, 061602 (2012) on 4 June 2012.
The manuscript submitted to physica status solidi (c) was part of the E‐MRS 2012 Spring Meeting, Symposium A, Proceedings. The authors regret the dual publication and express their sincere apologies to readers.
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