“…The measured n and k spectra denoted by ⟨ n ⟩ and ⟨ k ⟩, however, include information on surface roughness and bulk inhomogeneity of PEDOT:PSS and c-Si substrate. So far, the optical constant of PEDOT:PSS and Nafion has been studied using a Tauc-Lorentz (TL) model and a Cauchy model described in following eqs and , respectively. , Here, a combination of a TL model, a Drude model, and a Cauchy model was used to explain the ⟨ n ⟩ and ⟨ k ⟩ spectra of Nafion-modified PEDOT:PSS to analyze film thickness d and optical constant of bulk and intermixing layer components with and without taking an uniaxial optical anisotropy into a consideration, i.e., bulk component spectra of // PEDOT:PSS (ordinary n 0 , k 0 ) and ⊥PEDOT:PSS (extraordinary n e , k e ). , A three-layer model was applied combining with the effective medium approximation (EMA) where A , C , E 0 , and E g represent the resonance amplitude, the oscillator broadening parameter, the resonance energy, and the Tauc optical band gap, respectively. E p and γ also denote plasma frequency and damping factor, respectively.…”