Kinetic spectroscopic ellipsometry has been used to study the initial growth stage of poly(3,4-ethylene dioxythiophene):poly(styrene sulfonic acid) (PEDOT:PSS) films by the electrospray deposition (ESD) method. The real-time spectra analysis revealed that the surface overlayer decreased in thickness, once the first bulk layer monolayer was formed, indicating a smoothening effect as the nucleation-related microstructure coalesced into the bulk layer. Once the coalescence was completed and the nucleation-induced surface roughness layer was stabilized, the underlying bulk layer increased linearly with time. These results originate from the degrees of the evaporation of solvent material during the transfer of the precursors to the surface and/or of the diffusion of deposition precursors after sticking at the growing surface.
Highly-conductive poly(3,4-ethylene dioxythiophene):poly(styrene sulfonic acid) (PEDOT:PSS) films obtained by the addition of dimethylsulfoxide (DMSO) and the argon plasma exposure were used as a transparent conductive anode (TCA) for copper-phthalocyanine (CuPc)/C60 organic thin-film solar cells (OSCs). The CuPc/C60 OSCs on as-grown DMSO added PEDOT:PSS layer showed a power efficiency of 0.6%, whereas it was improved markedly to 1.34% after the atmospheric-pressure argon plasma exposure, which was comparable to that formed on indium-tin-oxide layer. Effects of the DMSO addition and the argon plasma exposure in the spin-coated PEDOT:PSS films is demonstrated in terms of the in-depth characterization of optical and electrical properties.
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