describing charge transport are the carrier mobility, charge generation/extraction, and carrier lifetime observed in fully assembled, operating solar cells. [5] There are several well-known experimental approaches toward estimation of these parameters including time-of-flight (TOF) photoconductivity, [6] space charge limited current (SCLC), [7] field-effect transistor (FET), [8] and charge extraction by linearly increasing voltage (CELIV). [9,10] However, each of them is hindered by an array of limitations. In principle, most commonly utilized TOF photoconductivity measurement is operated in direct current mode and requires application of very thick film in order to provide surface photogeneration for reliable observation of charge transport features, as well as the transit time. In addition, light bias is kept very low, ensuring charge carrier concentration to be much lower than the charge stored on the electrodes, resulting in constant electric field across the measured sample. These prerequisites are difficult to meet in the case of efficient thin film perovskite-based solar cells, especially when planar architecture is taken into consideration, as these devices are generally sub 500 nm thick. On the other hand, SCLC technique also comes with a set of drawbacks reflected through relationship between injected charge and distribution of occupancy within localized states, leading to oversimplification of results in respect to trapping states, sample homogeneity, temperature dependence, as well as quality of contact between electrodes and semiconductor. [11] In the case of charge mobility, poor injection of faster carriers in cells with unbalanced transport often leads to overestimation of retrieved values. Alternatively, dark injection SCLC can be utilized to study very thin films in a fashion highly similar to TOF, with exception of voltage step being used for generation of charge carriers instead of a laser pulse. The charge mobility obtained from FET measurement depends on the type of electrodes, semiconductor-dielectric interface, and the charge carrier concentration. Moreover, device geometry used for FET measurements differs considerably from diode configuration, thus charge transport properties obtained from FET architecture may not reliably reflect charge transport behavior of diode structures. CELIV has been widely used as a reliable tool in characterization of organic solar cells, [12,13] relying on triangle voltage Photoinduced charge selective carrier extraction by linearly increasing voltage technique allows straightforward assessment of charge transport properties within planar and mesostructured perovskite solar cells with respect to light intensity and signal delay time. Charge sensitive device architecture is realized through implementation of insulating layer between the anode or cathode to prevent extraction of unwanted type of carriers. Resulting behavior of comparatively efficient mesoporous and planar solar cells exhibits well balanced charge transport with slight dependence of charge mobili...