We study the temperature dependence of dielectric constant (K) and spontaneous polarization (Ps) in the range of −95–200°C. Cubic (C)-tetragonal (T) and T-orthorhombic (O) transitions are observed at 264 and 25°C, respectively. The Curie–Weiss temperature of C-T transition is 249°C, indicating it is first order. X-ray data indicate T-O phase coexistence at 25°C. A singularity in Ps at 25°C and a T-O phase coexistence spanning 25–31°C was observed, wherein Ps increases from 17×10−2C∕m2 at 31°Cto23×10−2C∕m2 25°C. The transition at 25°C appears diffusionless and polymorphic with martensite start and finish temperatures of 31 and 25°C, respectively. The maximum in d33 is 345pC∕N and is attributed to the instability at 25°C, where Ps and K show singularity.
Single phase, epitaxial, ⟨001⟩ oriented, undoped and 1mol% Mn-doped (K0.44,Na0.52,Li0.04)(Nb0.84,Ta0.10,Sb0.06)O3 thin films of 400nm thickness were synthesized on SrRuO3 coated SrTiO3. Such films exhibit well saturated hysteresis loops and have a spontaneous polarization (Ps) of 10μC∕cm2, which is a 150% higher over the Ps of the undoped composition. The coercive field of 1mol% Mn doped films is 13kV∕cm. Mn-doping results in three orders of magnitude decrease in leakage current above 50kV∕cm electric field, which we attribute to the suppression of intrinsic p-type conductivity of undoped films by Mn donors.
Recent progress in lead-free piezoelectric ceramics and thin films with special emphasis on alkaline niobatebased and bismuth sodium titanate-based systems is reviewed concisely. Modifications of potassium sodium niobate (KNN) ceramics are presented and subsequent improvements in the electrical properties are summarized. Special attention is devoted to the phase diagram of the KNN system when a solid solution is formed with other perovskite niobates and titanates. Impact of A-site and B-site dopants on the electromechanical properties of KNN ceramics are distinguished in view of transition temperatures. It is shown that the addition of most A-site and B-site dopants reduces the transition temperatures and improves the piezoactivity at room temperature. This is attributed to the shift of polymorphic transition from tetragonal to orthorhombic phase in the vicinity of room temperature. In contrast, formation of a solid solution of KNN with 18 mol% AgNbO₃ revealed a significant enhancement of properties without a notable change in the transition temperatures. Also, a bismuth sodium titanate (BNT) composition is introduced with particular emphasis on its binary and ternary derivatives. Moderate piezoelectric properties reported at the morphotropic phase boundaries, formed in BNT-based solid solutions are also represented. Advances on thin films based on these two compositions are evaluated and challenges involved with development of stoichiometric thin films with low leakage current are discussed.
Dielectric and piezoelectric properties of morphotropic phase boundary (Bi,Na)TiO 3-(Bi,K)TiO 3-BaTiO 3 epitaxial thin films deposited on SrRuO 3 coated SrTiO 3 substrates were reported. Thin films of 350 nm thickness exhibited small signal dielectric permittivity and loss tangent values of 750 and 0.15, respectively, at 1 kHz. Ferroelectric hysteresis measurements indicated a remanent polarization value of 30 µC/cm 2 with a coercive field of 85-100 kV/cm. The thin film transverse piezoelectric coefficient e 31,f of these films after poling at 600 kV/cm was found to be-2.2 C/m 2. The results indicate that these BNT-based thin films are a potential candidate for lead-free piezoelectric devices.
We report the effects of Ba, Ti, and Mn dopants on ferroelectric polarization and leakage current of (K0.44Na0.52Li0.04)(Nb0.84Ta0.1Sb0.06)O3 (KNN-LT-LS) thin films deposited by pulsed laser deposition. It is shown that donor dopants such as Ba2+, which increased the resistivity in bulk KNN-LT-LS, had an opposite effect in the thin film. Ti4+ as an acceptor B-site dopant reduces the leakage current by an order of magnitude, while the polarization values showed a slight degradation. Mn4+, however, was found to effectively suppress the leakage current by over two orders of magnitude while enhancing the polarization, with 15 and 23 μC/cm2 remanent and saturated polarization, whose values are ∼70% and 82% of the reported values for bulk composition. This phenomenon has been associated with the dual effect of Mn4+ in KNN-LT-LS thin film, by substituting both A- and B-site cations. A detailed description on how each dopant affects the concentrations of vacancies in the lattice is presented. Mn-doped KNN-LT-LS thin films are shown to be a promising candidate for lead-free thin films and applications.
We report the growth of single-phase (K0.44,Na0.52,Li0.04)(Nb0.84,Ta0.10,Sb0.06)O3 thin films on SrRuO3 coated ⟨001⟩ oriented SrTiO3 substrates by using pulsed laser deposition. Films grown at 600°C under low laser fluence exhibit a ⟨001⟩ textured columnar grained nanostructure, which coalesce with increasing deposition temperature, leading to a uniform fully epitaxial highly stoichiometric film at 750°C. However, films deposited at lower temperatures exhibit compositional fluctuations as verified by Rutherford backscattering spectroscopy. The epitaxial films of 400–600nm thickness have a room temperature relative permittivity of ∼750 and a loss tangent of ∼6% at 1kHz. The room temperature remnant polarization of the films is 4μC∕cm2, while the saturation polarization is 7.1μC∕cm2 at 24kV∕cm and the coercive field is ∼7.3kV∕cm. The results indicate that approximately 50% of the bulk permittivity and 20% of bulk spontaneous polarization can be retained in submicron epitaxial KNN-LT-LS thin film, respectively. The conductivity of the films remains to be a challenge as evidenced by the high loss tangent, leakage currents, and broad hysteresis loops.
We report the observation of domain structure and piezoelectric properties of pure and Mn-doped (K0.44,Na0.52,Li0.04)(Nb0.84,Ta0.1,Sb0.06)O3 (KNN-LT-LS) thin films on SrTiO3 substrates. It is revealed that, using piezoresponse force microscopy, ferroelectric domain structure in such 500 nm thin films comprised of primarily 180° domains. This was in accordance with the tetragonal structure of the films, confirmed by relative permittivity measurements and x-ray diffraction patterns. Effective piezoelectric coefficient (d
33) of the films were calculated using piezoelectric displacement curves and shown to be ∼53 pm V−1 for pure KNN-LT-LS thin films. This value is among the highest values reported for an epitaxial lead-free thin film and shows a great potential for KNN-LT-LS to serve as an alternative to PZT thin films in future applications.
Conduction mechanisms in epitaxial (001)-oriented pure and 1 mol % Mn-doped (K0.44,Na0.52,Li0.04)(Nb0.84,Ta0.1,Sb0.06)O3 (KNN-LT-LS) thin films on SrTiO3 substrate were investigated. Temperature dependence of leakage current density was measured as a function of applied electric field in the range of 200–380 K. It was shown that the different transport mechanisms dominate in pure and Mn-doped thin films. In pure (KNN-LT-LS) thin films, Poole-Frenkel emission was found to be responsible for the leakage, while Schottky emission was the dominant mechanism in Mn-doped thin films at higher electric fields. This is a remarkable yet clear indication of effect of 1 mol % Mn on the resistive behavior of such thin films.
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