2009
DOI: 10.1088/0022-3727/43/2/025405
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Nanoscale characterization and local piezoelectric properties of lead-free KNN-LT-LS thin films

Abstract: We report the observation of domain structure and piezoelectric properties of pure and Mn-doped (K0.44,Na0.52,Li0.04)(Nb0.84,Ta0.1,Sb0.06)O3 (KNN-LT-LS) thin films on SrTiO3 substrates. It is revealed that, using piezoresponse force microscopy, ferroelectric domain structure in such 500 nm thin films comprised of primarily 180° domains. This was in accordance with the tetragonal structure of the films, confirmed by relative permittivity measurements and x-ray diffraction patterns. Effective piezoelectric coeff… Show more

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Cited by 34 publications
(19 citation statements)
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“…[10][11][12] In spite of relatively high ferroelectric and piezoelectric properties, the films yet suffered from a high leakage current ͑e.g., Ͼ10…”
mentioning
confidence: 99%
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“…[10][11][12] In spite of relatively high ferroelectric and piezoelectric properties, the films yet suffered from a high leakage current ͑e.g., Ͼ10…”
mentioning
confidence: 99%
“…It should be noted that the current density in our KNLNT thin film is remarkably lower than that in the KNN-LT-LS based films. [10][11][12] It is speculated that the low current density is attributed to the strong ͑110͒ orientation, as the c-axis oriented or columnar-grained microstructure may offer more leakage current paths through the vertically aligned grain boundaries. 16 Since no significant asymmetry in J-E behavior upon reversal of the polarity of applied voltage can be observed, we will hereafter study the situation in which Pt electrode is positively biased.…”
mentioning
confidence: 99%
“…5.13b. The hardening effect of Mn has been also confirmed by the measurement of the piezoelectric coefficient (d 33 ) of base and Mn-doped films which shows that Mn-addition is accompanied by a decline in the d 33 value from 53 pm V À1 in an undoped film to 45 pm V À1 in an Mn-doped film [107]. Yamazoe et al [109] reported that the introduction of a NN buffer layer (150 nm thick) on Pt/(001)MgO substrates had a noticeable effect on the improvement of the ferroelectric properties of KNN-LT-LS films.…”
Section: à2mentioning
confidence: 71%
“…Abazari et al studied the effect of the substrate temperature and oxygen background pressure as well as different dopants (Mn, Ba, and Ti) on the ferroelectric properties of KNN-LT-LS thin films deposited on SrRuO 3 (SRO) coated SrTiO 3 (STO) substrates [103][104][105][106][107]. Figure 5.10 depicts the evolution of the microstructure of the KNN-LT-LS thin films at different deposition temperatures.…”
Section: Knn Films Prepared By Physical Deposition Techniquesmentioning
confidence: 99%
“…Values of ferroelectric polarization and piezoelectric coefficient are far inferior as compared to bulk KNN. Abazari et al studied the domain structure of epitaxial KNN-LT-LS lead-free piezoelectric thin films deposited on SrTiO 3 substrate and measured the effective longitudinal piezoelectric coefficient d 33 using PFM [109]. They found that films possessed tetragonal crystal structure with predominantly c-axis oriented domains and d 33 value was about 45 pmV À1 for 500 nm Mn-doped films.…”
Section: Chemical Depositionmentioning
confidence: 99%