Optical transmission of a two-dimensional array of subwavelength holes in a metal film has been numerically studied using a differential method. Transmission spectra have been calculated showing a significant increase of the transmission in certain spectral ranges corresponding to the excitation of the surface polariton Bloch waves on a metal surface with a periodic hole structure. Under the enhanced transmission conditions, the near-field distribution of the transmitted light reveals an intensity enhancement greater than 2 orders of magnitude in localized ( approximately 40 nm) spots resulting from the interference of the surface polaritons Bragg scattered by the holes in an array.
We report a study of the optical near field of an active integrated component operating near the 1.55-mum telecommunications wavelength. The device is based on a two-dimensional photonic crystal etched in a suspended InP membrane. Topographic as well as optical information is collected by use of a scanning near-field optical microscope in collection mode, providing information about the local distribution of the losses.
The Bloch mode spectrum of surface plasmon polaritons (SPPs) on a finite thickness metal film has been analyzed in the regimes of weak and strong coupling between SPP modes on the opposite film interfaces. The SPP mode dispersion and associated field distributions have been studied. The results have been applied to the description of the light transmission through thick and thin periodically structured metal films at oblique incidence. In contrast to normal incidence, all SPP Bloch modes on a grating structure participate in the resonant photon tunnelling leading to the transmission enhancement. However, at the angle of incidence corresponding to the crossing of different symmetry film SPP Bloch modes, the far-field transmission is suppressed despite the enhanced near-field transmission. The combined SPP mode consisting of the two film SPPs having different symmetries that is achieved at the crossing frequency exhibits no radiative losses on a structured surface.
We present a new form of optical microscope. An evanescent field is produced in the lower index medium of an ATR system and modulated by a sample deposited on the hypotenuse of the prism. A sharpened fiber optic probes this field and gives information about the topography of the surface.
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