A, 1 1~s~) arid K. KOHRA The kinematical and dynaniical component's of diffracted X-rays from perfect and mechanically dsinsged silicon single crystals are separately measured in t.he vicinity of the reciprocal lattice point using a triple crystal arrangement of ( j -n , --n, +n) setting. I n the case of a perfect' crystal, besides the normal dynamical diffraction, a broad and weak hump due to the lattice vibration is observed a t the scattering vector deviation as small as 2 x lo3 cni-l. For crystals with lapped and scratched surface a noticeable change of the int>ensity curves, i.e. a change! of the equal-intensity coiit,our in the reciprocal space, is observed.Die kinematischen und dynamischen Komponenten der gestreuten R,ontgenstrahlen von perfekten und niechanisch gestorten Siliziumeinkrist'ailen werden in der h'ahe von reziproken Gitterpunkten mit einem Dreikristalldiffraktometer in (+n, -I $ , + n ) Anordnang gemessen. I m Fall des perfekten Kristalls wird aul3er der normalen dynaniischen Beugting, ein breit.er und schm6chere.r Bnckel der Kurve infolge der Gitterschwingung bei Abweichungen des Streuvektors von ctwa 2 x lo3 cm-1 beobacht'et. Fur Kristalle mit polierten und geritzten Oberflachen wird eine nierkliche Anderung der Intensitatskurve, namlich eine anderung der Konturen gleicher Intensitgt im reziproken Gitterraum, beobachtet.

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X-ray diffraction phenomenon, for which the glancing angle of the incident beam is so small that the effect of specular reflection can not be neglected, is studied theoretically. Two wave fields, one of which is usually neglected, are considered as the solution of the dispersion equation, and the boundary conditions of the waves are considered for the gradient of amplitude normal to the surface besides the amplitude. Numerical calculations are made for (220) reflection of CuKα1 from a germanium single crystal. The diffracted beam is stronger in intensity and broader in half-value width than that where specular reflection is not considered.

The diffraction phenomena of X-rays in the case ΘB≅π/2 are studied on the basis of dynamical theory. The angular width of diffraction for ΘB= π/2, 2√|χh| , is about 103 times as broad as the one for ΘB ⪡π/2, 2|Xh|/sin ΘB . Similar characteristic phenomena are expected for electrons. The π/2 Bragg angle diffraction would be utilized as X-ray resonator.

X‐ray structure factors of germanium were determined for eight conventional reflections from the half‐widths of the Bragg‐case diffraction curves measured in the triple crystal‐arrangement and for the 222 (forbidden) reflection from the integrated intensity using CuKα1 radiation. The accuracy was better than 0.3% for 111 and 220, close to 0.5% for the remaining conventional reflections and about 8% for 222. The analysis of the effect of the covalent bonding was made with Dawson's method and a fairly good agreement was obtained between experiment and calculation.