An Application of Asymmetric Reflection for Obtaining X-ray Beams of Extremely Narrow Angular Spread

Köhra, Kazutake

doi:10.1143/jpsj.17.589

Cited by 125 publications

(36 citation statements)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…25,26) Since the crystal surface and diffraction plane chosen were (100) and (511), respectively, the asymmetry factor b was 0.207. 13,24) Finally, the beam was vertically expanded in the same way as in the horizontal case.…”

Section: Methodsmentioning

confidence: 99%

Direct Observations of Cracks and Voids in Structural Materials by X-ray Imaging Using Ultra-bright Synchrotron Radiation

Nakayama

Yuse

Tsubokawa³

et al. 2003

ISIJ International

View full text Add to dashboard Cite

Refraction contrast X-ray imaging experiments were conducted on acrylic resin with an artificial cylindrical hole, A7075 aluminum alloy, A6063 aluminum castings, mild steel with cracks or voids, and low alloy steel with inclusions, using a ultra-bright synchrotron radiation X-ray beam in BL24XU hutch C of SPring-8. Conventional absorption contrast X-ray imaging experiments were also done for the comparison. The X-ray beam was controlled to be monochromatic by Si double-crystals and collimated by a slit. The distance between the sample and the detector was changed from 0 to 3 m, and the X-ray energy was 15 to 25 keV. Photographs were taken by X-ray film and/or X-ray CCD camera. As a result, the refraction imaging method gave a much more distinct image of the artificial cylindrical hole in acrylic resin as compared with the absorption method. The fatigue cracks in aluminum alloy and mild steel were also distinctly observed. The Xray imaging revealed the presence of MnS nonmetallic inclusions in low alloy steel. Void defects in aluminum castings were clearly detected by the imaging. In addition, in-situ observation of tensile fracture of aluminum alloys using a high resolution X-ray CCD camera system was successfully conducted. The observations by use of asymmetric reflection technique for X-ray imaging experiment were also well performed. From above, the X-ray imaging method using ultra-bright synchrotron radiation is concluded to be very useful for fracture research of materials.KEY WORDS: synchrotron radiation; X-ray diagnosis; structural materials; fracture; refraction imaging. different information from conventional methods such as absorption contrast X-ray imaging, because much highly directional property is also available. That is why, based on the fact that the phase shift cross section for light element is almost a thousand times larger than the absorption one, especially in a hard X-ray region, new X-ray imaging techniques such as refraction method, 10-15) diffraction method, 15,16) inter-ferometric method 4,9,18) have recently been studied and proposed actively.The principle of refraction contrast X-ray imaging is shown in Fig. 2, as compared with conventional absorption X-ray imaging, illustrating the X-ray intensity profiles of the absorption contrast and refraction contrast for a void in material. In the conventional absorption method, the X-ray beam passing through the void is less absorbed, and the intensity pattern of the void area is simply stronger due to increased density of the X-ray transmission beam. On the other hand, the refraction contrast imaging, which is obtained by setting the sample some distance apart from the detector, forms a very weak line along the X-ray absorbed region (strong intensity region) due to the distribution of Xray direct beam differentiated from the refraction effect. As a result, this method provides a higher resolution image than the conventional absorption method. It is thought 20) that these refraction contrast X-ray imaging can be well performed only in the thir...

show abstract

Section: Methodsmentioning

confidence: 99%

Direct Observations of Cracks and Voids in Structural Materials by X-ray Imaging Using Ultra-bright Synchrotron Radiation

Nakayama

Yuse

Tsubokawa³

et al. 2003

ISIJ International

View full text Add to dashboard Cite

show abstract

“…asymmetric diffraction (Renninger, 1961;Kohra, 1962) or the control of a wave fan (Authier, 1960). Accordingly, when the distance between points A and B exceeds a certain critical value, two wave fields propagating along S, and $2 cannot interfere at the point P.…”

Section: Principlesmentioning

confidence: 99%

Measurement of the coherence length of highly collimated X-rays from the visibility of equal-thickness fringes

Ishikawa¹

1988

Acta Cryst Sect A

View full text Add to dashboard Cite

show abstract

“…T he workshop was held at Argonne N ational Laboratory from June 13 through Ju ly 15,1966, and was jointly sponsored by Argonne N ational Laboratory and the Associated M idwest Universities. T he workshop consisted of fifty invited participants from th e U nited States, Europe, and Japan.…”

Section: P Refacementioning

confidence: 99%

“…(15), one m ay note th a t (Cs ) 2 has an upper bound (Os ) 2 < p'i/2m1E. F or nonrelativistic electrons a t the source, this is $ 1 /E .…”

Section: The U Niversity Of Wisconsin M Adison Wisconsinmentioning

confidence: 99%

“…Experim ental values including these factors were obtained through use of the following m ethod.8, [13][14][15][16] When an electron beam penetrates the wedge-shaped section of a crystal specimen, the extinction contour (equal-thickness fringe) always appears in th e electronmicroscope image due to Bragg reflection. B y measuring intensity of the striped pattern of the image, a mean absorption coefficient (p0) can be obtained.…”

Section: B Penetrating Powermentioning

confidence: 99%

See 1 more Smart Citation

Proceedings of the Amu-Anl Workshop on High-Voltage Electron Microscopy, June 13--July 15, 1966.

1967

View full text Add to dashboard Cite

DISCLAIMERPortions of this document may be illegible in electronic image products. Images are produced from the best available original document. LEGAL NOTICE T h is report w as prepared as an account of G overnm ent sponsored work. N either th e U nited States, nor th e C om m ission, nor any person actin g on behalf of th e C om m ission:A. M ak es any warranty or.representation, expressed or im plied, with respect to the accuracy, com p leten ess, or usefulness of the inform ation contained in th is report, or th at th e use of any inform ation, apparatus, m eth od , or process disclosed in th is report m ay not infringe privately ow ned rights; or B . A ssum es any liab ilities w ith respect to th e use of, or for damages resulting from the use of any inform ation, apparatus, m ethod, or process disclosed in this report.As used in th e above, " person acting on behalf of th e Com m ission" includes any em ployee or con tractor of th e C om m ission, or em ployee of such contractor, to the exten t th at such em ployee or con tractor of th e C om m ission, or em ployee of such contractor prepares, dissem inates, or provides access to,, an y inform ation pursuant to his em ploym ent or contract with the C om m ission, or his em ploym ent w it h ' such contractor.

show abstract

An Application of Asymmetric Reflection for Obtaining X-ray Beams of Extremely Narrow Angular Spread

Cited by 125 publications

References 0 publications

Direct Observations of Cracks and Voids in Structural Materials by X-ray Imaging Using Ultra-bright Synchrotron Radiation

Direct Observations of Cracks and Voids in Structural Materials by X-ray Imaging Using Ultra-bright Synchrotron Radiation

Measurement of the coherence length of highly collimated X-rays from the visibility of equal-thickness fringes

Proceedings of the Amu-Anl Workshop on High-Voltage Electron Microscopy, June 13--July 15, 1966.

Contact Info

Product

Resources

About