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We report on the generation of triggered single photons obtained from epitaxially grown self-assembled CdSe/Zn(S,Se) quantum dots for temperatures up to 200 K. At low temperatures (T<40 K) photon correlation experiments under pulsed excitation show nearly perfect single-photon emission from an individual CdSe quantum dot. For higher temperatures (T>40 K) an increasing multi-photon emission probability due to spectrally overlapping acoustic phonon sidebands of neighboring quantum dots is observed. We found that the multi-photon emission probability of a bare quantum dot (background subtracted) is strongly suppressed at 200 K if compared to a Poissonian light source of the same average intensity. Our results demonstrate the large potential of self-assembled CdSe/Zn(S,Se) quantum dots for nonclassical light generation at temperatures up to 200 K.

In the present paper, studies on the state of strain in single and ensembles of nanocolumns investigated by photoluminescence spectroscopy will be presented. The GaN nanocolumns were either grown in a bottom-up approach or prepared in a top-down approach by etching compact GaN layers grown on Si(111) and sapphire (0001) substrates. Experimental evidence for strain relaxation of the nanocolumns was found. The difference and development of the strain value for different nanocolumns could be verified by spatially resolved micro-photoluminescence on single nanocolumns separated from their substrate. A common D0X spectral position at 3.473 eV was found for all separated single GaN nanocolumns independent of the substrate or processing technique used, as expected for a relaxed system.

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Monolithic II-VI pillar microcavities made of ZnSSe and MgS∕ZnCdSe supperlattices have been fabricated by molecular-beam epitaxy and focused-ion-beam etching. Discrete optical modes of the pillar microcavities are studied in photoluminescence measurements. The optical modes are identified by means of calculations based on an extended transfer matrix method. Achievable Purcell factors well above 10 can be estimated from the measured quality factors and calculated mode volumes.