Single-wall carbon nanotubes (SWNTs) were oxidatively functionalized by nitric acid treatment. The presence
of carboxyl groups was proven by IR spectroscopy, matching earlier IR and NMR observations. Raman
spectra in the radial breathing mode (RBM) and G line spectral windows were measured with six laser lines
ranging from 457 to 647 nm. The RBM mode was observed to upshift by the functionalization with very
little change in the spectral line shape. By the analysis of the spectral moments of the lines, this upshift is
interpreted as a change in an empirical intertube interaction function. In agreement with previous TEM results,
we have found that bundles in a pristine SWNT sample are significantly thinner (<10 tubes) than those in
the oxidized samples (>30 tubes). Changes observed in solvatation properties and sample morphology could
be explained on this basis. Our observations suggest that carboxyl related secondary bonding forces might
also play a role in the stacking of oxidized SWNTs.
New emerging technologies in the field of flexible electronic devices require that metal films adhere well and flex with polymer substrates. Common thin film materials used for these applications include copper (Cu) with an adhesion interlayer of chromium (Cr). Copper can be quite ductile and easily move with the polymer substrate. However, Cr is more brittle and fractures at lower strains than Cu. This study aims to examine the fracture and subsequent buckling and delamination of strained Cr films on polyimide (PI). In-situ scanning electron microscope (SEM) straining is used to systematically study the influence of film thickness on fracture and buckling strains. Film fracture and delamination depend on film thickness, and increases in crack and buckle density with decreasing thickness are explored by a shear lag model.
This Letter reports on an advanced out-of-plane bending mode for aluminum-nitride (AlN)-actuated cantilevers. Devices of different thickness were fabricated and characterized by optical and electrical measurements in air and liquid media having viscosities up to 615 cP and compared to the classical out-of-plane bending and torsional modes. Finite element method eigenmode analyses were performed showing excellent agreement with the measured mode shapes and resonance frequencies. Quality factors (Q-factor) and the electrical behavior were evaluated as a function of the cantilever thickness. A very high Q-factor of about 197 was achieved in deionized water at a low resonance frequency of 336 kHz, being up to now, the highest quality factor reported for cantilever sensors in liquid media. Compared to the quality factor of the common fundamental out-of-plane bending mode, a 5 times higher Q-factor was achieved. Furthermore, the strain related conductance peak of the roof tile-shaped mode is superior. Compared to any out-of-plane bending mode, this combination of most beneficial properties is unique and make this mode superior for a large variety of resonator-based sensing applications.
Small-scale and distortion-free measurement of electric fields is crucial
for applications such as surveying atmospheric electrostatic fields, lightning
research, and safeguarding areas close to high-voltage power lines. A variety of
measurement systems exist, the most common of which are field mills, which work
by picking up the differential voltage of the measurement electrodes while
periodically shielding them with a grounded electrode. However, all current
approaches are either bulky, suffer from a strong temperature dependency, or
severely distort the electric field requiring a well-defined surrounding and
complex calibration procedures. Here we show that microelectromechanical system
(MEMS) devices can be used to measure electric field strength without
significant field distortion. The purely passive MEMS devices exploit the effect
of electrostatic induction, which is used to generate internal forces that are
converted into an optically tracked mechanical displacement of a
spring-suspended seismic mass. The devices exhibit resolutions on the order of
100(V/m)/Hz with a measurement range of up to tens of
kilovolt per metre in the quasi-static regime (≲ 300 Hz).We also show
that it should be possible to achieve resolutions of around
∼1(V/m)/Hz by fine-tuning of the sensor embodiment. These
MEMS devices are compact and could easily be mass produced for wide
application.
Optical cavities are of central importance in numerous areas of physics, including precision measurement, cavity optomechanics and cavity quantum electrodynamics. The miniaturisation and scaling to large numbers of sites is of interest for many of these applications, in particular for quantum computation and simulation. Here we present the first scaled microcavity system which enables the creation of large numbers of highly uniform, tunable light-matter interfaces using ions, neutral atoms or solid-state qubits. The microcavities are created by means of silicon micro-fabrication, are coupled directly to optical fibres and can be independently tuned to the chosen frequency, paving the way for arbitrarily large networks of optical microcavities.
Optical resonators are essential for fundamental science, applications in sensing and metrology, particle cooling, and quantum information processing. Cavities can significantly enhance interactions between light and matter. For many applications they perform this task best if the mode confinement is tight and the photon lifetime is long. Free access to the mode center is important in the design to admit atoms, molecules, nanoparticles, or solids into the light field. Here, we demonstrate how to machine microcavity arrays of extremely high quality in pristine silicon. Etched to an almost perfect parabolic shape with a surface roughness on the level of 2 Å and coated to a finesse exceeding
F
= 500,000, these new devices can have lengths below 17 µm, confining the photons to 5 µm waists in a mode volume of 88λ
3
. Extending the cavity length to 150 µm, on the order of the radius of curvature, in a symmetric mirror configuration yields a waist smaller than 7 µm, with photon lifetimes exceeding 64 ns. Parallelized cleanroom fabrication delivers an entire microcavity array in a single process. Photolithographic precision furthermore yields alignment structures that result in mechanically robust, pre-aligned, symmetric microcavity arrays, representing a light-matter interface with unprecedented performance.
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