Two cases of a previously undescribed tumor were studied. The lesion is a primary pancreatic neoplasm, which by light microscopy has an appearance indistinguishable from that of a giant cell tumor of bone. Electron microscopy was done in one of the two cases. Both giant and “stromal” cells have abundant granular endoplasmic reticulum containing intracisternal granules of proteic nature similar to those described in pancreatic acinar cells. Microvilli are present in the giant cells, and numerous desmosomes are found between the “stromal” cells. These features are strongly suggestive that epithelial—and specifically acinar—elements are the cells of origin of the tumor.

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SRAMs are an integral part of system on chip devices. With transistor and gate length scaling to 65nm/45nm nodes, SRAM stability across the product's lifetime has become a challenge. Negative bias temperature instability, defects, or other phenomena that may manifest itself as a transistor threshold voltage (V T ) increase can result in VMIN drift of SRAM memory cells through burn-in and/or operation. A direct assessment at time-zero is difficult because the transistor V T has not yet shifted, and therefore no capability to screen VMIN shift at time zero can be developed. This work describes a methodology developed on 65nm low power and high performance process technologies at Texas Instruments for screening SRAM cells at time zero before they become reliability issues. IntroductionSRAM reliability on sub-65nm nodes has become a significant challenge. Transistor mis-match at time zero, as well as over the lifetime of a product, could result on memory fails. The screening techniques used to date count on failure mechanisms being present at time zero in order for them to be screened, or they attempt to guard-band products with ranges large enough to contain forecasted shifts. This paper presents a methodology developed on 65nm low power and high performance process technologies at Texas Instruments that is able to screen memory cells that are likely to have stability issues over the lifetime of a product.