IR drop is a fundamental constraint required by almost all chip designs. However, its evaluation usually takes a long time that hinders mitigation techniques for fixing its violations. In this work, we develop a fast dynamic IR drop estimation technique, named PowerNet, based on a convolutional neural network (CNN). It can handle both vector-based and vectorless IR analyses. Moreover, the proposed CNN model is general and transferable to different designs. This is in contrast to most existing machine learning (ML) approaches, where a model is applicable only to a specific design. Experimental results show that PowerNet outperforms the latest ML method by 9% in accuracy for the challenging case of vectorless IR drop and achieves a 30× speedup compared to an accurate IR drop commercial tool. Further, a mitigation tool guided by PowerNet reduces IR drop hotspots by 26% and 31% on two industrial designs, respectively, with very limited modification on their power grids.
Placement migration is the movement of cells within an existing placement to address a variety of post-placement design closure issues, such as timing, routing congestion, signal integrity, and heat distribution. To fix a design problem, one would like to perturb the design as little as possible while preserving the integrity of the original placement. This work presents a new diffusion-based placement method based on a discrete approximation to a closedform solution of the continuous diffusion equation. It has the advantage of smooth spreading, which helps preserve neighborhood characteristics of the original placement. Applying this technique to placement legalization demonstrates significant improvements in wire length and timing compared to other commonly used techniques.
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