Since 1990, an important change inelectronic design and test methodolo-James Beauung gieshas been under way. The change is facilitated byANSI/IEEE 1149.1, F. Edward Crane, III which is known as theTest-Access Port and Boundary-Scan Architecture Najml T. Jarwala standard. AT&T Bell Laboratories played a major role inthe promulgation Rodham E. Tullo.. ofthis standard, and AT&T design and manufacturing engineers have been implementing its provisions for several years. Thispaper reports onthe ways inwhich the standard has been employed in developing AT&T products, the benefits thathave been achieved, and the future opportunities available using the technology it details.
The rapid movement toward ultra-large-scale integration (ULSI) is significantly increasing the demands on testing technology for digital devices. Evolving test methodologies mustbe well integrated into the overall product realization process -from initial concept, through design, to field support. To maintain ever-increasing quality standards, high-quality tests mustidentify defective units at eachlevel ofsystem hierarchy. In addition, they must isolate faults to allow for efficient replacement and repair. Future demands on testing technology can be divided into sixmajor areas: product quality, device technology, testability scope, process integration, efficiency, and automation.
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