Boundary-Scan Testing for Electronic Subassemblies and Systems

Abstract

Since 1990, an important change inelectronic design and test methodolo-James Beauung gieshas been under way. The change is facilitated byANSI/IEEE 1149.1, F. Edward Crane, III which is known as theTest-Access Port and Boundary-Scan Architecture Najml T. Jarwala standard. AT&T Bell Laboratories played a major role inthe promulgation Rodham E. Tullo.. ofthis standard, and AT&T design and manufacturing engineers have been implementing its provisions for several years. Thispaper reports onthe ways inwhich the standard has been employed in developing AT&T products, the benefits thathave been achieved, and the future opportunities available using the technology it details.