In this paper, a novel fabrication technology of atomic force microscopy (AFM) probes integrating cantilever tips with an NV-rich diamond particle is presented. Nanomanipulation techniques combined with the focused electron beam-induced deposition (FEBID) procedure were applied to position the NV-rich diamond particle on an AFM cantilever tip. Ultrasonic treatment of nanodiamond suspension was applied to reduce the size of diamond particles for proper geometry and symmetry. The fabricated AFM probes were tested utilizing measurements of the electrical resistance at highly oriented pyrolytic graphite (HOPG) and compared with a standard AFM cantilever performance. The results showed novel perspectives arising from combining the functionalities of a scanning AFM with optically detected magnetic resonance (ODMR). In particular, it offers enhanced magnetometric sensitivity and the nanometric resolution.
We present a method for the quantitative determination of the photon force (PF)—the force generated by the radiation pressure of photons reflected from the surface. We propose an experimental setup integrating innovative microelectromechanical system (MEMS) optimized for the detection of photon force (pfMEMS). An active microcantilever was used as the force detector, while the measurement was conducted in a closed-loop setup with electromagnetic force compensation. In opposition to our previous works, this measurement method provides quantitative not qualitative assessment of PF interaction. Final current-balance setup is suitable for light sources from tens of microwatts to few watts. In our article, we present the results of the performed experiments, in which we measured the PF interactions in the range up to 67.5 pN with resolution of 30 fN in the static measurement.
In this work, macro- and nanodiagnostic procedures for working, third-generation photovoltaic devices based on a modified polymer:fullerene (P3HT:PCBM) absorber were conducted using atomic force microscopy (AFM) and impedance spectroscopy (IS) equipment. All experiments were performed both in the dark and under irradiation with a specific light wavelength. Photoactive Kelvin probe force microscopy (p-KPFM) and impedance spectroscopy (p-IS) experiments were conducted on half- and whole-solar cell devices. Based on the p-KPFM measurements, the surface potential (SP) and surface photovoltage (SPV) on top of the active layer at the micro/nanoscale were estimated for various light wavelengths (red, green, blue, and white). For light in the red spectrum range, which was associated with an optical absorption edge and acceptor states that occurred in the band gap of the P3HT material after doping the donor polymer with iodine, the SPV was measured at levels of 183 mV, 199 mV, and 187 mV for the samples with 0%, 5% and 10% iodine doping, respectively. In addition, a macroscale investigation enabling the determination of the electrical parameters of the studied organic solar cells (OSCs) was carried out using p-IS. Based on the data obtained during p-IS experiments, it was possible to propose a series electrical equivalent circuit to define and describe the charge transfer phenomenon in the OSCs. Estimations of data obtained from the fitting of the experimental results of p-IS under white light allowed us to evaluate the average diffusion time of electric charges at 8.15 µs, 16.66 µs, and 24.15 µs as a function of organic layer thickness for the device without doping and with 5% and 10% iodine doping. In this study, we demonstrated that correlating information obtained at the macro- and nanoscale enabled a better understanding of the electrical charge distribution of OSCs for indoor applications.
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