The phase noise of phase/frequency detectors can significantly raise the in-band phase noise of frequency synthesizers, corrupting the modulated signal. This paper analyzes the phase noise mechanisms in CMOS phase/frequency detectors and applies the results to two different topologies. It is shown that an octave increase in the input frequency raises the phase noise by 6 dB if flicker noise is dominant and by 3 dB if white noise is dominant. An optimization methodology is also proposed that lowers the phase noise by 4 to 8 dB for a given power consumption. Simulation and analytical results agree to within 3.1 dB for the two topologies at different frequencies.
A direct-conversion receiver employs a 1-to-6 transformer as a low-noise amplifier along with passive mixers and noninvasive baseband filters. Realized in 65-nm CMOS technology, the receiver provides an average noise figure of 5.3 dB and a sensitivity of ,70 dBm at a data rate of 54 Mb/s. The prototype draws 11.6 mW from a 1-V supply and occupies an active area of 0.18 mm 2 .
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