This paper aimed at identifying the error sources that occur in dimensional measurements performed using atomic force microscopy. In particular, a set of characterization techniques for errors quantification is presented. The discussion on error sources is organized in four main categories: scanning system, tip-surface interaction, environment, and data processing. The discussed errors include scaling effects, squareness errors, hysteresis, creep, tip convolution, and thermal drift. A mathematical model of the measurement system is eventually described, as a reference basis for errors characterization, with an applicative example on a reference silicon grating

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The EU crystalline silicon (c‐Si) PV manufacturing industry has faced strong foreign competition in the last decade. To strive in this competitive environment and differentiate itself from the competition, the EU c‐Si PV manufacturing industry needs to (1) focus on highly performing c‐Si PV technologies, (2) include sustainability by design, and (3) develop differentiated PV module designs for a broad range of PV applications to tap into rapidly growing existing and new markets. This is precisely the aim of the 3.5 years long H2020 funded HighLite project, which started in October 2019 under the work program LC‐SC3‐RES‐15‐2019: Increase the competitiveness of the EU PV manufacturing industry. To achieve this goal, the HighLite project focuses on bringing two advanced PV module designs and the related manufacturing solutions to higher technology readiness levels (TRL). The first module design aims to combine the benefits of n‐type silicon heterojunction (SHJ) cells (high efficiency and bifaciality potential, improved sustainability, rapidly growing supply chain in the EU) with the ones of shingle assembly (higher packing density, improved modularity, and excellent aesthetics). The second module design is based on the assembly of low‐cost industrial interdigitated back‐contact (IBC) cells cut in half or smaller, which is interesting to improve module efficiencies and increase modularity (key for application in buildings, vehicles, etc.). This contribution provides an overview of the key results achieved so far by the HighLite project partners and discusses their relevance to help raise the EU PV industries' competitiveness. We report on promising high‐efficiency industrial cell results (24.1% SHJ cell with a shingle layout and 23.9% IBC cell with passivated contacts), novel approaches for high‐throughput laser cutting and edge re‐passivation, module designs for BAPV, BIPV, and VIPV applications passing extended testing, and first 1‐year outdoor monitoring results compared with benchmark products.

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The aim of this study is to assess angle-dependent systematic errors and measurement uncertainties for a conoscopic holography laser sensor mounted on a Coordinate Measuring Machine (CMM). The main contribution of our work is the definition of a methodology for the derivation of point-sensitive systematic and random errors, which must be determined in order to evaluate the accuracy of the measuring system. An ad hoc three dimensional artefact has been built for the task. The experimental test has been designed so as to isolate the effects of angular variations from those of other influence quantities that might affect the measurement result. We have found the best measurand to assess angle-dependent errors, and found some preliminary results on the expression of the systematic error and measurement uncertainty as a function of the zenith angle for the chosen measurement system and sample material