2002
DOI: 10.1063/1.1531221
|View full text |Cite
|
Sign up to set email alerts
|

Wafer-scale integration of GaAs optoelectronic devices with standard Si integrated circuits using a low-temperature bonding procedure

Abstract: A methodology for the heterogeneous integration of epitaxial GaAs wafers with fully processed standard bipolar complementary metal-oxide-semiconductor Si wafers is presented. The complete low-temperature wafer bonding process flow, including procedures for the Si wafer planarization and GaAs substrate removal, has been developed and evaluated. The implementation of an in-plane optical link, consisting of an edge-emitting laser diode, a waveguide and a photodiode, is demonstrated.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

0
10
0

Year Published

2003
2003
2020
2020

Publication Types

Select...
4
3
2

Relationship

0
9

Authors

Journals

citations
Cited by 26 publications
(10 citation statements)
references
References 4 publications
(4 reference statements)
0
10
0
Order By: Relevance
“…Hybrid integration of III-V semiconductors with Si has been extensively investigated by using heteroepitaxial growth [5][6][7] or wafer bonding techniques. 8 Recently, an evanescent laser with low-temperature bonding technique has also been developed on Si. 9 However, the performance of III-V semiconductor lasers on Si is still poor due to the large differences in lattice constants and thermal expansion coefficients between GaAs and Si as well as anti-phase domain (APD) problems.…”
Section: Introductionmentioning
confidence: 99%
“…Hybrid integration of III-V semiconductors with Si has been extensively investigated by using heteroepitaxial growth [5][6][7] or wafer bonding techniques. 8 Recently, an evanescent laser with low-temperature bonding technique has also been developed on Si. 9 However, the performance of III-V semiconductor lasers on Si is still poor due to the large differences in lattice constants and thermal expansion coefficients between GaAs and Si as well as anti-phase domain (APD) problems.…”
Section: Introductionmentioning
confidence: 99%
“…Over the past 10 years, direct wafer bonding has received considerable attention for releasing the restrictions of lattice matching imposed by epitaxial growth and opening new degrees of freedom for the design of semiconductor devices [1][2][3][4][5][6][7][8][9][10]. During the wafer bonding process, thermal treatment is a very important step, which increases the surface energy and bonding strength of the bonded wafers [11].…”
Section: Introductionmentioning
confidence: 99%
“…Manipulating biological objects such as cells, DNA and chromosomes is frequently performed in bio-science and bio-engineering [1,2]. On the other hand, new mechatronic products integrating precise mechanisms, actuators and sensors with smaller and smaller sizes are expected continuously [3,4].…”
Section: Introductionmentioning
confidence: 99%