2006
DOI: 10.1016/j.mseb.2006.06.009
|View full text |Cite
|
Sign up to set email alerts
|

Strain analysis of InP/InGaAsP wafer bonded on Si by X-ray double crystalline diffraction

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

0
5
0

Year Published

2010
2010
2017
2017

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(5 citation statements)
references
References 33 publications
0
5
0
Order By: Relevance
“…The above discussions indicates that under the optimal conditions of preparation of SAR, that is, 0.25wt.% initiator to AA, 0.25wt.% crosslinking agent, 70% neutralization degree of AA, microwave power level of 320W, irradiation time of 5min, the SAR with the distilled water absorption rate of 1388g•g -1 (20℃) is obtained. Compared to the literature [8], the absorption rate increases 40% and the irradiation time shortens 37%.…”
Section: Effects Of Monomermentioning
confidence: 59%
See 1 more Smart Citation
“…The above discussions indicates that under the optimal conditions of preparation of SAR, that is, 0.25wt.% initiator to AA, 0.25wt.% crosslinking agent, 70% neutralization degree of AA, microwave power level of 320W, irradiation time of 5min, the SAR with the distilled water absorption rate of 1388g•g -1 (20℃) is obtained. Compared to the literature [8], the absorption rate increases 40% and the irradiation time shortens 37%.…”
Section: Effects Of Monomermentioning
confidence: 59%
“…In literature, the reports about the preparation of SRA using cellulose under microwave irradiation are few. Zhao and co-workers [8] have studied about it. However, the distilled water absorption rate at 20℃ is no more than 1000g•g -1 and the irradiation time needs 8min.…”
Section: Introductionmentioning
confidence: 99%
“…In [2][3][4][5][6][7], the thermal stresses of bonding materials were analyzed by using a two-dimensional plane structure. But they did not analyze the annealing process from the three-dimensional point of view and could not reflect the thermal deformation and thermal stress distribution.…”
Section: Introductionmentioning
confidence: 99%
“…But they did not analyze the annealing process from the three-dimensional point of view and could not reflect the thermal deformation and thermal stress distribution. The references [2,4,[6][7][8][9] analyzed the effect of annealing temperature on thermal stresses, while the influence of wafer thickness on thermal stresses was analyzed by [2,[5][6][7]10]. The references [11,12] analyzed the effect of annealing temperature on bonding strength.…”
Section: Introductionmentioning
confidence: 99%
“…The observation of the variation of the lattice plane spacing as a function of the plane orientation in the sample coordinate system is described in Noyan and Cohen (1987) and Welzel et al (2005). Here a polycrystalline material is suited at best; also the thin-layer analysis is realizable (Zhao et al , 2006). Moreover, single-crystal investigations (Ortner, 2005) are also possible.…”
Section: Introductionmentioning
confidence: 99%