2011
DOI: 10.5012/bkcs.2011.32.3.783
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Volatile Nickel Aminoalkoxide Complexes as Liquid Precursors for Non-volatile Memory Device of NiO Films by ALD

Abstract: Recently, NiO film of metal-oxide-metal (MOM) structure 1a has drawn much attention because it shows reproducible resistance switching phenomena applicable to next generation nonvolatile resistive random access memory (ReRAM) device. The resistance switching phenomenon, that is, a drastic change in resistance between a high-resistance state (OFFstate) and low resistance state (ON-state) in current-voltage (I-V) characteristic of MOM structure, has been observed in binary oxides such as NiO, 1 TiO 2 , 2 Nb 2 O … Show more

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Cited by 11 publications
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References 18 publications
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